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pro vyhledávání: '"M.G. Stout"'
Akademický článek
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Publikováno v:
Engineering Fracture Mechanics. 67:1-20
The fracture process of a material denoted PBS 9501 sugar mock, a simulant of the PBX 9501 high explosive, was studied using the optical technique of Coherent Gradient Sensing (CGS) interferometry. We found that in the PBS 9501 sugar mock material, c
Publikováno v:
Composites Science and Technology. 59:2339-2350
The contrasting characteristics of damage evolution have been examined in a multidirectional carbon/epoxy composite laminate (IM7/8551-7) subjected to both quasi-static and dynamic loading. Our experiments were performed on bend-test bars that were l
Publikováno v:
Key Engineering Materials. :473-478
Fiber microbuckling is the primary failure mechanism in unidirectional fiber-reinforced composites under compression. Due to processing or service conditions, damage (e.g., microcracks) exists at fiber/matrix interfaces. The effect of damage on the m
Publikováno v:
International Journal of Solids and Structures. 31:2999-3021
Thin-walled closed tubes of 70-30 brass were homogeneously deformed to finite levels of strain by internal fluid pressure combined with external longitudinal load in arbitrary fixed ratios. Plastic orthotropy was present initially and remained coaxia
Publikováno v:
Philosophical Magazine A. 66:1037-1064
The mixed-mode interfacial fracture toughness of an alumina/niobium system is investigated. The interface was formed by solid-state bonding bulk Coor's AD-999 fine-grain alumina with a commercial purity niobium. The interface is very sharp; data acqu
Publikováno v:
International Journal of Solids and Structures. 29:571-589
Two types of test specimen for determining interfacial fracture toughness are calibrated in this paper. Previous studies have shown that interfacial fracture toughness is strongly dependent on mode mixity. Both specimen types presented are well-suite
Autor:
K.P. Tumin, M.G. Stout
Publikováno v:
ISQED
A scan-based test methodology was adopted for the Freescale S08 and RS08 (8-bit) families of microcontrollers (MCUs) several years ago. This methodology has been shown to provide high quality testing and is an important part of Freescale's "Zero Defe
Akademický článek
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Publikováno v:
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
This paper compares the development and effectiveness of scan-based testing and functional testing using two microcontroller studies. This design-for-test methodology has been shown to reliably produce high quality products. This approach also provid