Zobrazeno 1 - 10
of 44
pro vyhledávání: '"M.G. Nakhodkin"'
Publikováno v:
Ukrainian Journal of Physics. 62:692-698
Autor:
M.I. Fedorchenko, M.G. Nakhodkin
Publikováno v:
Ukrainian Journal of Physics; Vol. 60 No. 2 (2015); 97
Український фізичний журнал; Том 60 № 2 (2015); 97
Український фізичний журнал; Том 60 № 2 (2015); 97
Changes in the electronic properties of the Si(100) surface, when a multilayer structure of oxidized Gd atoms is created on it, have been studied, by using the electron spectroscopy methods. It is shown that, after a number of adsorption cycles of Gd
Publikováno v:
Ukrainian Journal of Physics; Vol. 60 No. 2 (2015); 148
Український фізичний журнал; Том 60 № 2 (2015); 148
Український фізичний журнал; Том 60 № 2 (2015); 148
The rarely observed Si(001)-c(8 × 8) reconstruction is a unique nanostructured state of the Si(001) surface. It was obtained through the sample contamination with trace amounts of Cu below the electron spectroscopy detection limit. As our detailed S
Publikováno v:
Ukrainian Journal of Physics; Vol. 60 No. 11 (2015); 1132
Український фізичний журнал; Том 60 № 11 (2015); 1132
Український фізичний журнал; Том 60 № 11 (2015); 1132
The c(2×8) ground state reconstruction of the Ge(111) surface can be easily disrupted by the 2×2 reconstruction, since both of them are rather close to each other in terms of the surface free energy. Both structures are comprehensively studied in t
Autor:
M.I. Fedorchenko, M.G. Nakhodkin
Publikováno v:
Ukrainian Journal of Physics; Vol. 61 No. 3 (2016); 248
Український фізичний журнал; Том 61 № 3 (2016); 248
Український фізичний журнал; Том 61 № 3 (2016); 248
Electronic and emission properties of photocathodes fabricated on the basis of multilayered structures of oxidized Gd atoms deposited on the Si(100) surface and additionally covered with fresh layers of Gd atoms have been studied as functions of the
Publikováno v:
Ukrainian Journal of Physics; Vol. 61 No. 1 (2016); 75
Український фізичний журнал; Том 61 № 1 (2016); 75
Український фізичний журнал; Том 61 № 1 (2016); 75
We report on the 5.5√3 × 5.5√3 − R30 ∘ overlayer superstructure observed by the scanning tunneling microscopy on the Ge(111) surface. It shows pronounced effects of the local density of states leading to the strong dependence of STM images o
Publikováno v:
Ukrainian Journal of Physics. 60:46-51
Publikováno v:
Ukrainian Journal of Physics; Vol. 59 No. 8 (2014); 805
Український фізичний журнал; Том 59 № 8 (2014); 805
Український фізичний журнал; Том 59 № 8 (2014); 805
The growth of ultra-thin bismuth films up to 15 atomic layers on the atomically clean Ge(111)-c(2×8) substrate at 300 K is investigated before and after the annealing at 450 K by means of ultra-high vacuum scanning tunneling microscopy. The whole ra
Publikováno v:
Ukrainian Journal of Physics; Vol. 59 No. 2 (2014); 148
Український фізичний журнал; Том 59 № 2 (2014); 148
Український фізичний журнал; Том 59 № 2 (2014); 148
Elastic stresses arising at the clean GexSi1−x/Si(001) surface, as well as at the initial stages of its oxidation, are considered qualitatively by analyzing the changes of unit cell dimensions occurring owing to the ad-dimer formation or the atomic
Publikováno v:
Materialwissenschaft und Werkstofftechnik. 44:129-135
A brief overview of hexagonal superstructures with a periodicity of similar to 3 nm formed on Ru(0001) and Ge(111) by graphene or hexagonal boron nitride with a thickness of just a single atomic layer is given. A periodic height corrugation of such l