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of 103
pro vyhledávání: '"M.B. Stearns"'
Publikováno v:
IEEE Transactions on Magnetics. 30:720-722
A new detection system, installed on a scanning transmission microscope, enables operation of the microscope in a variety of modes revealing microscopic and magnetic structure and dynamic magnetic phenomena at high spatial and temporal resolution. Ex
Publikováno v:
Physics of X-Ray Multilayer Structures.
High-resolution electron microscopy (HREM), with a resolution below 2Å, is the best tool for observing the actual detailed structure for ML. This gives direct atomic scale information about the film structure, including the bilayer thickness, the cr
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 50:122-123
The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date
Autor:
M.B. Stearns
Publikováno v:
Materials Science and Engineering: B. 3:409-412
A cursory review is made of the present state of metallic multilayer (ML) fabrication and their quality using the degree of coherence in the growth direction as the main criteria. It is seen that the quality of ML is not particularly sensitive to the
Autor:
M.B. Stearns
Publikováno v:
Physica B+C. 91:37-42
Hyperfine field and saturation magnetization data are analyzed to obtain solute transition element moments and Fe moment perturbations in dilute Fe alloys. A direct comparison of these results is made with the neutron scattering data. The host moment
Publikováno v:
Physical Review. 108:445-449
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Publikováno v:
Physical Review. 97:240-242
Autor:
M.B. Stearns, S. Shinozaki
Publikováno v:
Physica B+C. :1195-1196
The transmission spectra of electrons from the 3p→3d transition of Cr, Mn, Fe, Co and Ni have been measured and analyzed to obtain information about the localization of the d states. By combining this data with soft X-ray emission data we obtain th
Publikováno v:
Physical Review. 96:804-805