Future Contributions

Autor: S. Ando, J. Angulo, D. Batchelor, E. Bayro Corrochano, C. Beeli, C. Bobisch, R. Möller, F. Bociort, E. Bosch, I. Lazic, K. Bredies, A. Broers, N. Chandra, R. Ghosh, A. Cornejo Rodriguez, F. Granados Agustin, K. Edee, C. Edgcombe, J. Elorza, R.G. Forbes, P.L. Gai, E.D. Boyes, M. Haschke, R. Herring, B. McMorran, M.S. Isaacson, K. Ishizuka, K. Jensen, D. Shiffler, J. Luginsland, M. Jourlin, U. Kaiser, T. Kirk, A.I. Kirkland, R. Clough, J. Mir, C.T. Koch, O.L. Krivanek, M. Kroupa, B. Lencová, H. Lichte, M. Matsuya, J.A. Monsoriu, L. Muray, S.A. Nepijko, V.G. Dyukov, G. Schönhense, M.A. O'Keefe, D. Paganin, T. Gureyev, K. Pavlov, N. Papamarkos, A. Kesidis, H. Qin, Q. Ramasse, R. Brydson, B. Rieger, A.J. Koster, P. Rocca, M. Donelli, J. Rodenburg, J. Rouse, H.-n. Liu, E. Munro, J. Sánchez, P. Santi, P. Sciau, R. Shimizu, T. Ikuta, Y. Takai, T. Soma, I.J. Taneja, T. Tanigaki, J. Valdés

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c8676ee7ac99b3a02d33a1d58bfa2aed
https://doi.org/10.1016/s1076-5670(16)30053-2

Forthcoming Contributions

Autor: L. Alvarez Leon, J.-M. Morel, D. Antzoulatos, W. Bacsa, N.D. Black, R. Millar, M. Kunt, F. Ziliani, M. Reid, N. Bonnet, G. Borgefors, A. van den Bos, A. Dekker, O. Bostanjoglo, S. Boussakta, A.G.J. Holt, P.G. Casazza, J.A. Dayton, E.R. Dougherty, Y. Chen, J.M.H. Du Buf, R.G. Forbes, E. Förster, F.N. Chukhovsky, A. Fox, M. Gabbouj, M.J. Fransen, A. Gasteratos, I. Andreadis, W.C. Henneberger, M.I. Herrera, L. Brú, K. Ishizuka, C. Jeffries, M. Jourlin, J.-C. Pinoli, E. Kasper, A. Khursheed, G. Kögel, K. Koike, P.V. Kolev, M. Jamal Deen, W. Krakow, A. van de Laak-Tijssen, E. Coets, T. Mulvey, L.J. Latecki, J.-M. Lina, B. Goulard, P. Turcotte, C. Mattiussi, S. Mikoshiba, F.L. Curzon, R.L. Morris, J.G. Nagy, P.D. Nellist, S.J. Pennycook, M.A. O'Keefe, G. Nemes, B. Olstad, M. Omote, S. Sakoda, C. Passow, E. Petajan, V.E. Ptitsin, F.A. Ponce, J.W. Rabalais, H. Rauch, D. Saldin, G.E. Sarty, G. Schmahl, J.P.F. Sellschop, S. Shirai, M. Shnaider, A.P. Paplinski, T. Soma, I. Talmon, S. Tari, J. Toulouse, T. Tsutsui, Z. Dechun, Y. Uchikawa, D. van Dyck, J.S. Villarrubia, L. Vincent, N. White, J.B. Wilburn, C.D. Wright, E.W. Hill, T. Yang

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::83249e2731837247526c06ce2c6bf7d3
https://doi.org/10.1016/s1076-5670(13)70002-8

HRTEM investigation of the interface between AIN and SiC

Autor: F.A. Ponce, M.A. O’Keefe, E.C. Nelson

Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 54:122-123

Epitaxial thin films of the group III nitrides play an increasingly important role in the fabrication of high-efficiency light emitting diodes in the range between yellow and blue. Growth of such films on sapphire requires the use of low temperature

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::af37be9b634eeb66933367a4a7a5895f
https://doi.org/10.1017/s0424820100163071

A project for on-line remote control of a high-voltage TEM

Autor: D. Owen, K.H. Westmacott, U. Dahmen, B. Parvin, D. Agarwal, M.A. O'Keefe, R. Gronsky

Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 53:82-83

On-line microscopy commenced with demonstrations for biological and SEM applications. For materials science, a project has recently been established to provide users of the NCEM with remote online access to a 1.5MeV Kratos EM-1500 high-voltage transm

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1362c4aaefbaf81654f6a6437cd2b0fb
https://doi.org/10.1017/s0424820100136787

Screw Dislocations in GaN Grown by Different Methods.

Autor: Z. Liliental-Weber, D. Zakharov, J. Jasinski, M.A. O'Keefe, H. Morkoc

Publikováno v: Microscopy & Microanalysis; Feb2004, Vol. 10 Issue 1, p47-54, 8p