Zobrazeno 1 - 10
of 96
pro vyhledávání: '"M. Zier"'
Autor:
M. Zier
Publikováno v:
Meteorologische Zeitschrift, Vol 1, Iss 5, Pp 221-228 (1992)
In den oberen Lagen der deutschen Mittelgebirge kommt sowohl dem Spurenstoffeintrag durch Nebelwasserdeposition als auch der dadurch verursachten Belastung von Waldökosystemen große Bedeutung zu. Unter diesen Aspekten wurden 1987 mit einem Passivsa
Externí odkaz:
https://doaj.org/article/6db27e5a561748099155174aa5842303
Publikováno v:
Meteorologische Zeitschrift, Vol 1, Iss 5, Pp 262-266 (1992)
Schönwiese, C.-D., unter Mitwirkung von P. Bisolli, W. Birrong und R. Ullrich: Anthropogene, klimawirksame Spurenstoffe. Mengen, Wirkung, Folgen, Gegenmaßnahmen. Klimatologische Aspekte. - Ber. d. Inst. f. Meteorologie u. Geophysik d. Univ. Frankfu
Externí odkaz:
https://doaj.org/article/bcee83e9ff424b32a5855bf16d6ca899
Akademický článek
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Autor:
Julie P. Katkin, Jorge A. Coss-Bu, M.C. Gazzaneo, Brian Rissmiller, Janaki Paskaradevan, M. Zier
Publikováno v:
TP19. TP019 QUALITY, PROCESS, AND OUTCOMES IN ACUTE AND CRITICAL CARE.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c06f9468e0b3549053b6278b9570197
https://doi.org/10.1164/ajrccm-conference.2021.203.1_meetingabstracts.a1702
https://doi.org/10.1164/ajrccm-conference.2021.203.1_meetingabstracts.a1702
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 273:18-21
Hydrogen analysis is of particular importance in thin film technology and it is often necessary to obtain a depth profile. The method with the best depth resolution is NRA using the 6385 keV resonance of the 1H(15N,αγ)12C nuclear reaction. The corr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::349f32350ec25684a414811415d4f219
https://doi.org/10.1016/j.nimb.2011.07.027
https://doi.org/10.1016/j.nimb.2011.07.027
Publikováno v:
physica status solidi (a). 207:743-747
An X-ray Si L 2,3 -emission spectroscopy study of a SiO 2 /n-Si heterostructure containing a thin oxide layer of d = 20 nm thickness implanted by Si + ions with an energy 12keV is reported. The maximum concentration of implanted Si + ions is located
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddb7d5bcd70cae992d7ccce1da6f7afd
https://doi.org/10.1002/pssa.200925469
https://doi.org/10.1002/pssa.200925469
Akademický článek
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Autor:
Ivo W. Rangelow, M. Zielony, Andreas Frank, Wolfgang Engl, Tzv. Ivanov, M. Zier, Teodor Gotszalk, Y. Sarov, B. E. Volland, S. Klett, Thomas Sulzbach, K. Ivanova, D. Dontzov, N. Nikolov, P. Zawierucha, Ch. Bitterlich, Walter Schott, U. Wenzel, Bernd Schmidt, Jens-Peter Zöllner, Ivan Kostic
Publikováno v:
Journal of Vacuum Science & Technology B 26(2008)6, 2367-2373
Scanning proximity probes are uniquely powerful tools for analysis, manipulation, and bottom-up synthesis. A massively parallel cantilever-probe platform is demonstrated. 128 self-sensing and self-actuated proximal probes are discussed. Readout based
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::99a75a23f4909b6f60cf95029873c01e
https://doi.org/10.1116/1.2990789
https://doi.org/10.1116/1.2990789
Autor:
A. Almansa, Stefan Kolb, M. Zielony, V. Djakov, B. Schmidt, Ivo W. Rangelow, B. E. Volland, D. Dontzov, J. Mielczarski, N. Nikolov, M. Zier, K. Ivanova, S. E. Huq, Tzv. Ivanov, H. O. Blom, T. Sulzbach, R. Pedreau, P. Zawierucha, Ivan Kostic, O. Fortagne, Piotr Grabiec, Du P. Latimier, Wolfgang Engl, Y. Sarov, Teodor Gotszalk, Klaus Edinger, Arun Persaud
Publikováno v:
Microelectronic Engineering 84(2007)5-8, 1260-1264
A major limitation for future nanotechnology, particularly for bottom-up manufacturing is the non-availability of 2-dimensional massively parallel probe arrays. Scanning proximity probes are uniquely powerful tools for analysis, manipulation and bott
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::11d4adad557ff863c4aa892809b11849
https://doi.org/10.1016/j.mee.2007.01.219
https://doi.org/10.1016/j.mee.2007.01.219
Publikováno v:
physica status solidi c. 4:1830-1835
The aim of the experiments was the characterization of the first stages of film growth on silicon substrates with scanning tunneling microscopy (STM) and angle-resolved X-ray photoelectron spectroscopy (ARXPS). Thin Ta films were deposited in situ by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d9194b9fc1782b23c1c1319d7e254aa
https://doi.org/10.1002/pssc.200675221
https://doi.org/10.1002/pssc.200675221