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pro vyhledávání: '"M. Y. Myl'nikov"'
Autor:
M. Y. Myl'nikov, Vladimir N. Genkin
Publikováno v:
Advances in Resist Technology and Processing XI.
The development processes in microlithography consist in removing of exposure region with rate V exceeding the dissolution rate of unexposed regions. The technology characteristics of the resists are the contrast, the sensitivity and the resolution.
Autor:
M. Y. Myl'nikov, Vladimir N. Genkin
Publikováno v:
Advances in Resist Technology and Processing X.
In the fabrication of integrated circuits (IC) the solubility dependence of a polymer on its macromolecular length is used. The development process is multistage and involves series thicknesses just as in photo and plasma etching. In lithography this