Zobrazeno 1 - 10
of 15
pro vyhledávání: '"M. V. Zeller"'
Publikováno v:
Langmuir. 11:127-135
The adsorption and thermal decomposition of a model polypernuorinated ether on high surface area Al 2 O 3 has been studied using transmission infrared spectroscopy. It has been found that (C 2 F 5 ) 2 O interacts with the isolated OH groups on the Al
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5540630578886a776211c84cffbb63e9
https://doi.org/10.1021/la00001a024
https://doi.org/10.1021/la00001a024
Publikováno v:
Journal of The Electrochemical Society. 137:221-225
Silicon dioxide films grown under dry and wet oxidation environment on beta-SiC films have been studied. The beta-SiC films had been heteroepitaxially grown on both on-axis and 2-deg off-axis (001) Si substrates. Capacitance-voltage and conductance-v
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70b060c9abb27a464da55c4d36f4f7a3
https://doi.org/10.1149/1.2086370
https://doi.org/10.1149/1.2086370
Publikováno v:
ChemInform. 21
Silicon dioxide films grown under dry and wet oxidation environment on beta-SiC films have been studied. The beta-SiC films had been heteroepitaxially grown on both on-axis and 2-deg off-axis (001) Si substrates. Capacitance-voltage and conductance-v
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a95de85c997563d18970427677e6d52f
https://doi.org/10.1002/chin.199013328
https://doi.org/10.1002/chin.199013328
Autor:
M. V. Zeller, S. J. Hahn
Publikováno v:
Surface and Interface Analysis. 11:327-334
X-ray photoelectron spectroscopy was used to track chemical structure changes in conducting polypyrrole films which were electrochemically grown at various current densities. The film structures were correlated to changes in the film electrical condu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f165af42d97e093c919890b5fd3b2051
https://doi.org/10.1002/sia.740110610
https://doi.org/10.1002/sia.740110610
Publikováno v:
Surface and Interface Analysis. 3:211-225
Quantitative information from electron spectroscopy for chemical analysis requires the use of suitable atomic sensitivity factors. An empirical set has been developed, based upon data from 135 compounds of 62 elements. Data upon which the factors are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::190e688a0ceaa4bc557c0e12e934f114
https://doi.org/10.1002/sia.740030506
https://doi.org/10.1002/sia.740030506
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 4:1692-1695
Several surface modificaation techniques were performed in situ in an ultrahigh vacuum as part of a program to develop electrical contacts on the (100) face of cubic SiC. The Auger electron spectroscopy line shapes and peak-to-peak heights of the Si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae6a112e4ee73a17fcece82976ab545b
https://doi.org/10.1116/1.573957
https://doi.org/10.1116/1.573957
Publikováno v:
Inorganic Chemistry. 12:1431-1433
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f5aa4b67d74e7eecb08288803723b99
https://doi.org/10.1021/ic50124a045
https://doi.org/10.1021/ic50124a045
Publikováno v:
MRS Proceedings. 97
After Nichrome, Ni, Cr, and Au/Ta films are deposited onto single crystals of cubic SiC, their reactivities at the metal-semiconductor interface are studied by Auger Electron Spectroscopy. For all metals except Ni, metal carbides are detected at the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2cd4d30c71f706e79b1ecc242d107e39
https://doi.org/10.1557/proc-97-283
https://doi.org/10.1557/proc-97-283
Autor:
M. V. Zeller, J. J. Bellina
Publikováno v:
MRS Proceedings. 97
The reaction of thin Ti films deposited, in situ, onto (100) 3C-SiC has been studied by Auger Electron Spectroscopy, and Low Energy Electron Diffraction. The effects of reaction temperature and SiC surface condition were investigated as part of a pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52c075eb51932c47e43ed49778177bfd
https://doi.org/10.1557/proc-97-265
https://doi.org/10.1557/proc-97-265
Autor:
J. J. Bellina, M. V. Zeller
Publikováno v:
Amorphous and Crystalline Silicon Carbide and Related Materials ISBN: 9783642934087
Amorphous and Crystalline Silicon Carbide and Related Materials
Amorphous and Crystalline Silicon Carbide and Related Materials
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5bf54de7bf5f1c6a4c49c95b1c7bb82d
https://doi.org/10.1007/978-3-642-93406-3_19
https://doi.org/10.1007/978-3-642-93406-3_19
