Zobrazeno 1 - 10
of 32
pro vyhledávání: '"M. V. Rzheutski"'
Autor:
M. V. Rzheutski, Ja. A. Solovjov, A. G. Vainilovich, I. Ya. Svitsiankou, A. N. Pyatlitski, D. V. Zhyhulin, E. V. Lutsenko
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 0, Iss 7 (125), Pp 144-151 (2019)
In order to develop a technology for the growth of Al(Ga)N-based heterostructures, the effect of different molecular beam epitaxy growth conditions on the properties of AlN and AlGaN layers was studied. The optimal conditions for the growth of AlN bu
Externí odkaz:
https://doaj.org/article/72fe1d83a59943ab97e0cb4f9685c8b3
Autor:
S. V. Nikanenka, E. V. Lutsenko, A. V. Danilchyk, V. A. Dlugunovich, V. A. Zhdanovskii, A. V. Kreidzich, A. A. Liplianin, M. V. Rzheutski
Publikováno v:
Pribory i Metody Izmerenij, Vol 6, Iss 1, Pp 10-17 (2015)
Information about principle of operation of the setup for measurement of the photometric, radiometric, spectral and spatial characteristics of radiation of laser diodes and LEDs in the spectral range from 250 to 900 nm constructed in the B.I. Stepano
Externí odkaz:
https://doaj.org/article/c0336184dcb841429fe847827d343281
Autor:
Ja. А. Solovjov, D. V. Zhyhulin, A. N. Pyatlitski, E. V. Lutsenko, A. G. Vainilovich, M. V. Rzheutski, I. E. Svitsiankou
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 0, Iss 7 (125), Pp 144-151 (2019)
In order to develop a technology for the growth of Al(Ga)N-based heterostructures, the effect of different molecular beam epitaxy growth conditions on the properties of AlN and AlGaN layers was studied. The optimal conditions for the growth of AlN bu
Autor:
Dmitrii V. Nechaev, Stefan Ivanov, Evgenii V. Lutsenko, V. N. Jmerik, M. V. Rzheutski, A. V. Danilchyk, A. V. Nagorny
Publikováno v:
Quantum Electronics. 49:535-539
The stimulated emission and photoluminescence of ultrathin GaN quantum wells with a nominal thickness of 1.5 – 2 monolayers (MLs) and AlN barrier layers 4 – 6.66 ML thick, obtained by plasma-activated molecular beam epitaxy on c-sapphire substrat
Autor:
A. N. Alekseev, I. E. Svitsiankou, G. P. Yablonskii, A. V. Nagorny, A. N. Pyatlitski, A. G. Vainilovich, D. V. Zhigulin, V. A. Shulenkova, V. A. Solodukha, Ya. A. Solov’ev, S. I. Petrov, Evgenii V. Lutsenko, M. V. Rzheutski
Publikováno v:
Quantum Electronics. 49:540-544
By optimising the growth temperature of the AlGaN layers and using high-temperature AlN buffer layers, high-quality Al x Ga1 – x N layers (x = 0.15, 0.21, 0.26, and 0.3) were obtained, in which stimulated emission in the UV spectral range 330 – 2
Autor:
V. V. Mamaev, Evgenii V. Lutsenko, M. V. Rzheutski, A. N. Alexeev, S. I. Petrov, S.A. Novikov
Publikováno v:
Journal of Crystal Growth. 514:40-44
It is shown that the use of high-temperature AlN/AlGaN buffer layers grown by NH3-MBE at extremely high temperatures (up to 1200 °C) allows one to improve drastically the structural quality of topmost GaN layer. The influence of an ammonia flow in t
Autor:
E. V. Muravitskaya, S. I. Petrov, E. V. Lutsenko, A. N. Alexeev, V. A. Shulenkova, M. V. Rzheutski, I. E. Svitsiankou, A. G. Vainilovich, G. P. Yablonskii
Publikováno v:
Semiconductors. 52:2107-2110
The effect of molecular-beam epitaxy (MBE) growth conditions on properties of AlN epitaxial layers was investigated resulting in determination of optimal substrate temperature and ammonia flow. Optimal substrate temperature for growth of GaN and AlGa
Autor:
Dmitri S Arteev, Andrey F. Tsatsulnikov, Alexei V. Sakharov, W. V. Lundin, Evgenii V. Lutsenko, M. V. Rzheutski, E. E. Zavarin
Publikováno v:
Semiconductor Science and Technology. 36:125007
The influence of dislocations on luminescence of InGaN/GaN multiple quantum wells was investigated by temperature-dependent and time-resolved room-temperature photoluminescence measurements and analyzed via localized-state ensemble model. The results
Autor:
M. S. Leanenia, G. P. Yablonskii, T. G. Naghiyev, Evgenii V. Lutsenko, M. V. Rzheutski, O. B. Tagiev
Publikováno v:
Journal of Applied Physics. 129:243104
The photoluminescence (PL) of CaGa2S4:Pr3+ chalcogenide semiconductor compound is studied. The PL spectrum consists of a set of intense sharp lines at 494, 631, 654, and 741 nm, formed by intra-4f transitions of Pr3+ ions. The energy level diagram of
Autor:
Evgenii V. Lutsenko, M. V. Rzheutski, S. A. Abushev, M. S. Leanenia, V. N. Pavlovskii, O. B. Tagiev, G. P. Yablonskii, T. G. Naghiyev, B. G. Tagiev
Publikováno v:
Journal of Luminescence. 181:121-127
The detailed investigation of CaxBa1−xGa2S4:Eu2+ solid solutions photoluminescence caused by 5d→4f electronic transitions in Eu2+ ions with x value from 0.1 to 0.9 in wide excitation intensity and temperature intervals was performed. It is shown