Zobrazeno 1 - 10
of 467
pro vyhledávání: '"M. Tehranipoor"'
Publikováno v:
IEEE Photonics Journal, Vol 6, Iss 1, Pp 1-9 (2014)
We propose an optical security method for object authentication using photon-counting encryption implemented with phase encoded QR codes. By combining the full phase double-random-phase encryption with photon-counting imaging method and applying an i
Externí odkaz:
https://doaj.org/article/283ad21846ae472c9522e79aac8050e7
Autor:
M. Shafkat M. Khan, Chengjie Xi, Aslam A. Khan, M. Tanjidur Rahman, Mark M. Tehranipoor, Navid Asadizanjani
Publikováno v:
IEEE Design & Test. 39:156-164
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5014e3dc943bd01cb991aa3f2ee0abd
https://doi.org/10.1109/mdat.2022.3151020
https://doi.org/10.1109/mdat.2022.3151020
Autor:
Mark M. Tehranipoor
Publikováno v:
Proceedings of the Great Lakes Symposium on VLSI 2023.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::637d6d41ed39b82a5b8cd3afae6b236c
https://doi.org/10.1145/3583781.3592464
https://doi.org/10.1145/3583781.3592464
Autor:
Nidish Vashistha, Muhammad Monir Hossain, Md Rakib Shahriar, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor
Publikováno v:
IEEE Transactions on Consumer Electronics. 68:23-37
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4bcc4cc7eb5e164ceaa37319e8ef0171
https://doi.org/10.1109/tce.2021.3139090
https://doi.org/10.1109/tce.2021.3139090
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdd8c877f11efd294e1b2603f241b779
https://doi.org/10.1109/itc50671.2022.00023
https://doi.org/10.1109/itc50671.2022.00023
Publikováno v:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08811e847950be636be5138ff74fbc8f
https://doi.org/10.1109/ipfa55383.2022.9915720
https://doi.org/10.1109/ipfa55383.2022.9915720
Autor:
Chengjie Xi, Aslam A. Khan, Nathan Jessurun, Nidish Vashisthan, Mark M. Tehranipoor, Navid Asadizanjani
Publikováno v:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::949cef3f8d0de9cffd66ec2c1f29df3d
https://doi.org/10.1109/ipfa55383.2022.9915749
https://doi.org/10.1109/ipfa55383.2022.9915749
Akademický článek
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Autor:
Aslam A. Khan, Keon Sahebkar, Chengjie Xi, Mark M. Tehranipoor, Ryan F. Need, Navid Asadizanjani
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b59305eed872afd7b6547b130052c5c
https://doi.org/10.1109/ectc51906.2022.00366
https://doi.org/10.1109/ectc51906.2022.00366
Autor:
Chengjie Xi, Nathan Jessurun, John True, Aslam A. Khan, Mark M. Tehranipoor, Navid Asadizanjani
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd48d2bc40e4ad468fd40606d423ef28
https://doi.org/10.1109/ectc51906.2022.00355
https://doi.org/10.1109/ectc51906.2022.00355