Zobrazeno 1 - 6
of 6
pro vyhledávání: '"M. Tauseef Rab"'
Publikováno v:
DFTS
A scheme is presented which uses one sequential linear decompressor to decompress test cubes and another sequential linear decompressor to decompress mask control data for masking unknown X's in the output response. However, instead of the convention
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a14ee702015705b5fdaa06d615860e55
https://doi.org/10.1109/dft.2013.6653594
https://doi.org/10.1109/dft.2013.6653594
Publikováno v:
DFT
When assembling a three-dimensional integrated circuit (3D-IC), there are several degrees of freedom including which die are stacked together, in what order, and with what rotational symmetry. This paper describes strategies for exploiting these degr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::416b090f2a7678fbc5e5dcffde372c70
https://doi.org/10.1109/dft.2012.6378220
https://doi.org/10.1109/dft.2012.6378220
Publikováno v:
VLSI-SoC
Three-dimensional (3D) technology makes it possible to organize memories as cell arrays stacked on logic where upper die layers contain the cell arrays and the bottom layer implements the peripheral logic. This creates new degrees of freedom that can
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8cad2e3a41caaba0926c7adfab47003f
https://doi.org/10.1109/vlsi-soc.2012.7332100
https://doi.org/10.1109/vlsi-soc.2012.7332100
Publikováno v:
DFT
An X-Canceling MISR [Touba 07] provides the ability to tolerate unknowns (X's) in the output response with very little loss of observability of non-X values. When the density of X's is low, an X-Canceling MISR is extremely efficient as the number of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3fcdb052b51987761c065b7489dd8e1c
https://doi.org/10.1109/dft.2012.6378193
https://doi.org/10.1109/dft.2012.6378193
Publikováno v:
2013 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFTS); 2013, p1-14, 14p
Publikováno v:
2012 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFT); 1/ 1/2012, pi-ix, 9p