Zobrazeno 1 - 7
of 7
pro vyhledávání: '"M. T. Spaar"'
Autor:
T. Tanigaki, H. Shichi, Heinrich F. Arlinghaus, M. T. Spaar, P. H. Holloway, Adam McMahon, N. Thonnard
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 11:2317-2323
Sputter‐initiated resonance ionization spectroscopy (SIRIS) is an analytical technique with extremely high sensitivity, selectivity, dynamic range, and quantitation accuracy. SIRIS also provides good spatial resolution, and freedom from matrix effe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ede08ae6947f3c23079cdb0928c71016
https://doi.org/10.1116/1.578369
https://doi.org/10.1116/1.578369
Autor:
K. B. Jacobson, Richard A. Sachleben, Frederick V. Sloop, M. T. Spaar, Heinrich F. Arlinghaus, J. R. Peterson, Robert S. Foote, Gilbert M. Brown, N. Thonnard
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 9:1312-1319
Resonance ionization spectroscopy (RIS) is becoming recognized as an emerging field with wide applications. RIS is an analytical technique providing extreme element sensitivity and selectivity by detecting ionization produced from lasers tuned to exc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56e49743cb99708717dc124e92b310e6
https://doi.org/10.1116/1.577618
https://doi.org/10.1116/1.577618
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:2318-2322
Sputter‐initiated resonance ionization spectroscopy (SIRIS) is a very selective and extremely sensitive technique to analyze semiconductor materials. In the SIRIS technique, the abundant neutral atoms released by the sputtering process are ionized
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e64c36e3d5018b38deaf5f226abca80e
https://doi.org/10.1116/1.576756
https://doi.org/10.1116/1.576756
Publikováno v:
SPIE Proceedings.
Resonance Ionization Spectroscopy (RIS), an analytical technique with extremely high element specificity and sensitivity, is becoming recognized as an emerging field with wide applications. The sensitivity and selectivity of the RIS process is especi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::264b931639ef5bf23491ad76e4a405ca
https://doi.org/10.1117/12.44228
https://doi.org/10.1117/12.44228
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12:263
Sputter‐initiated resonance ionization spectroscopy (SIRIS) is an emerging analytical technique for quantitative and sensitive measurements of impurities and ultra‐shallow doping profiles in semiconductors. SIRIS has almost all of the advantages
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4799a76eacfbb99eaa702c657700484a
https://doi.org/10.1116/1.587151
https://doi.org/10.1116/1.587151
Publikováno v:
Physica B+C. 130:225-227
Magnetic susceptibility measurements have been made on samples of californium-249 metal having the dhcp crystal structure. At temperatures between 100 and 340 K and at fields up to 50 kilogauss, the samples exhibit Curie-Weiss behavior. Previous meas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70e9934cc6f8bcf59b2435302cb278d6
https://doi.org/10.1016/0378-4363(85)90225-6
https://doi.org/10.1016/0378-4363(85)90225-6
Publikováno v:
MRS Proceedings. 6
The electronic charge states and site symmetries of the radioactive ions incorporated in nuclear waste forms are of considerable importance in determining the physical and chemical properties of these materials. An in situ characterization of these i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0d661359f6bac4ace92b566e04a11fc
https://doi.org/10.1557/proc-6-59
https://doi.org/10.1557/proc-6-59