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pro vyhledávání: '"M. T. Schaal"'
Autor:
Steven A. Bradley, G. J. Gajda, S. I. Sanchez, Y. Le, M. T. Schaal, P.L. Bogdan, S. M. Tonnesen, Lawrence F. Allard
Publikováno v:
Microscopy Today. 26:24-31
Aberration-corrected STEM has become a standard analytical technique in the field of nanoscience. As “designer materials” have become more in demand in academic circles, verification of a desired product makes atomic-resolutionanalysis mandatory.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b56391c16967ac7af4e6ef4acb100dc
https://doi.org/10.1017/s1551929518000469
https://doi.org/10.1017/s1551929518000469
