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pro vyhledávání: '"M. S. S. Mohamad Saofi"'
Publikováno v:
2020 IEEE International Conference on Semiconductor Electronics (ICSE).
This paper investigates the effects of Negative Bias Temperature Instability (NBTI) & Positive Bias Temperature Instability (PBTI) on 2-to-1 multiplexer circuit performances. The key objective of this research is to analyse the effects of NBTI and PB
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfce6e5b02bf1816481f3a581379df08
https://doi.org/10.1109/icse49846.2020.9166861
https://doi.org/10.1109/icse49846.2020.9166861
