Zobrazeno 1 - 10
of 15
pro vyhledávání: '"M. S. Rodgers"'
Autor:
Kenneth A. Peterson, Samuel L. Miller, G La Vigne, P. Clews, Danelle M. Tanner, M. S. Rodgers, Jeffry J. Sniegowski
Publikováno v:
Microelectronics Reliability. 39:1229-1237
In order for the rapidly emerging field of MicroElectroMechanical Systems (MEMS) to meet its extraordinary expectations regarding commercial impact, issues pertaining to how they fail must be understood. We identify and address failure modes common t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46481ff2500c9059de492aca42337eb7
https://doi.org/10.1016/s0026-2714(99)00013-x
https://doi.org/10.1016/s0026-2714(99)00013-x
Publikováno v:
Integrated Ferroelectrics. 2:91-104
Discrepancies in switched polarization values obtained with pulse measurements and hysteresis measurements have been observed in ferroelectric PZT thin film capacitors. We attribute the differences as partially due to the effects of rapid depolarizat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06aeadbb10be2d6c6d336c90f3bf51f5
https://doi.org/10.1080/10584589208215735
https://doi.org/10.1080/10584589208215735
Publikováno v:
Journal of Applied Physics. 70:2849-2860
The switching behavior of ferroelectric capacitors experiencing arbitrary time‐dependent electric fields and arbitrary initial conditions is investigated both theoretically and experimentally. A general approach for modeling incomplete dipole switc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::750ac28c23b48d6affbf68e7800fb31c
https://doi.org/10.1063/1.349348
https://doi.org/10.1063/1.349348
Publikováno v:
Journal of Applied Physics. 68:6463-6471
A physically based methodology is developed for modeling the behavior of electrical circuits containing nonideal ferroelectric capacitors. The methodology is illustrated by modeling the discrete ferroelectric capacitor as a stacked dielectric structu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ac394fe7ee45404e6dd0a1010c41e8a
https://doi.org/10.1063/1.346845
https://doi.org/10.1063/1.346845
Publikováno v:
IEEE Transactions on Nuclear Science. 37:1703-1712
The radiation hardness of thin-film PbZr/sub y/Ti/sub 1-y/O/sub 3/ (PZT) ferroelectric capacitors is explored. Ferroelectric capacitors were irradiated using X-ray and Co-60 sources to dose levels up to 16 Mrad(Si). The capacitors were characterized
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de95cd435cc143b2908dcd617e1f251a
https://doi.org/10.1109/23.101180
https://doi.org/10.1109/23.101180
Autor:
John L. McCall, M S Rodgers
Publikováno v:
The British journal of surgery. 87(9)
Background Liver resection for colorectal metastases is the only known treatment associated with long-term survival; extrahepatic disease is usually considered a contraindication to such treatment. However, some surgeons do not regard spread to the h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba062d188e29a5ad9b59df8e6b2c4c38
https://pubmed.ncbi.nlm.nih.gov/11122201
https://pubmed.ncbi.nlm.nih.gov/11122201
Autor:
M. S. Rodgers, J. J. Sniegowski
Publikováno v:
1998 Solid-State, Actuators, and Microsystems Workshop Technical Digest.
The authors recently reported on the development of a 5-level poly-ilicon surface micromachine fabrication process consisting of four levels of mechanical poly plus an electrical interconnect layer. They are now reporting on the first components desi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4dde5b51da66a03417b62681ad03b359
https://doi.org/10.31438/trf.hh1998.32
https://doi.org/10.31438/trf.hh1998.32
Autor:
Kenneth A. Peterson, Jeffry J. Sniegowski, Samuel L. Miller, Danelle M. Tanner, P. Clews, G.F. LaVigne, M. S. Rodgers
Publikováno v:
1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98.
In order for the rapidly emerging field of microelectromechanical systems (MEMS) to meet its extraordinary expectations with regard to commercial impact, issues pertaining to failure must be understood. We identify failure modes common to a broad ran
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5008e71787172263ca845e4eb0a1e255
https://doi.org/10.1109/relphy.1998.670437
https://doi.org/10.1109/relphy.1998.670437
Autor:
J B, Russell, M S, Rodgers
Publikováno v:
Obstetrics and gynecology clinics of North America. 18(1)
The literature concerning ectopic pregnancy is reviewed with regard to the information on multiple ectopic pregnancies. The epidemiology, causes, and treatments for multiple ectopic pregnancies are summarized. In addition, the results of radical and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::cfb21a4680a0e44673883a371cc14b8c
https://pubmed.ncbi.nlm.nih.gov/1923254
https://pubmed.ncbi.nlm.nih.gov/1923254
Autor:
M. S. Rodgers, Marty R. Shaneyfelt, K.L. Hughes, F.W. Sexton, Daniel M. Fleetwood, J.R. Schwank
Publikováno v:
IEEE Transactions on Nuclear Science. 36:1971-1980
Direct-correlation and simple overstress methods for estimating IC response in strategic and space environments from laboratory transistor and IC data are investigated. Transistors and ICs were irradiated at dose rates from 0.2 rad(SiO/sub 2/)/s to 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95b2fe985324f0cbd9007b6644676c12
https://doi.org/10.1109/23.45394
https://doi.org/10.1109/23.45394