Zobrazeno 1 - 10
of 38
pro vyhledávání: '"M. Rodriguez-Girones"'
Autor:
Lorenz-Peter Schmidt, M. Rodriguez-Girones, B. Mottet, Oleg Cojocari, S. Biber, H.L. Hartnagel
Publikováno v:
Semiconductor Science and Technology. 20:23-32
This paper presents results which originated from a long-term systematic optimization of surface processing prior to anode formation of THz Schottky-based components. Particularly, four most promising surface-processing approaches are carefully inves
Autor:
Lorenz-Peter Schmidt, B. Mottet, G. Rehm, M. Rodriguez-Girones, Hans L. Hartnagel, S. Biber, Oleg Cojocari
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 53:581-587
An automated system is developed to evaluate a large number Schottky diodes for terahertz applications with respect to their dc and noise characteristics using a highly sensitive noise measurement technique for one port devices. An extensive RF switc
Autor:
Oleg Cojocari, Lorenz-Peter Schmidt, L. Marchand, B. Mottet, S. Biber, M. Rodriguez-Girones, Hans L. Hartnagel
Publikováno v:
Semiconductor Science and Technology. 19:537-542
This paper presents the evaluation of a Schottky contact technology based on electrochemical metal deposition. The results of a long-term systematic investigation and optimization of the anode formation process to improve the yield and performance of
Autor:
Hans L. Hartnagel, D. Kraft, Ralf Hunger, Wolfram Jaegermann, David Ensling, Victoria M. Ichizli, T. Mayer, M. Rodriguez-Girones
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 200:432-438
Preparation steps of Pt/n-GaAs Schottky contacts as applied in the fabrication process of varactor diode arrays for THz applications are analysed by photoelectron spectroscopy. Pulsed cathodic deposition of Pt onto GaAs (1 0 0) wafer surfaces from ac
Publikováno v:
Microelectronics Reliability. 42:1563-1568
Autor:
B. Mottet, Hans L. Hartnagel, Oleg Cojocari, L. Marchand, C. Garden, M. Rodriguez-Girones, Victoria M. Ichizli
Publikováno v:
Microelectronics Reliability. 42:1593-1596
Publikováno v:
Applied Surface Science. 190:428-436
Basic THz elements are produced by standard semiconductor science and technology. Therefore, three main material systems are used. These are first of all semiconductors, for active and passive layer formation; metals, for interconnect and contact for
Publikováno v:
Materials Science Forum. :173-180
With growing interest in applications in the THz regime, techniques related to THz-devices and circuits become increasingly important. In the frequency range of the so-called submillimeter waves, device dimensions are comparable to the wavelength. Th
Autor:
Luca Perregrini, Maurizio Bozzi, M. Rodriguez-Girones, Hans L. Hartnagel, M. Saglam, A. Megej
Publikováno v:
International Journal of Infrared and Millimeter Waves. 22:429-438
This paper presents the fabrication and characterization of four-barrier planar heterostructure-barrier-varactors (HBVs) to be used in frequency triplers. The fabrication process and the DC and RF testing results are discussed. The measured results a
Autor:
A. Megej, M. Saglam, B. Schumann, R. Judaschke, C. Domoto, J. Muller, M. Rodriguez-Girones, K. Duwe, Hans L. Hartnagel
Publikováno v:
IEEE Electron Device Letters. 24:138-140
In this letter, we report on the record performance of GaAs-based heterostructure barrier varactors (HBVs) in tripler circuits. Both fabrication technique of planar Al/sub 0.7/Ga/sub 0.3/As/GaAs heterostructure barrier varactors (HBVs) and measuremen