Zobrazeno 1 - 6
of 6
pro vyhledávání: '"M. Reyes Elizalde"'
Autor:
Brian K. Tanner, David Allen, Jochen Wittge, Andreas N. Danilewsky, Jorge Garagorri, Eider Gorostegui-Colinas, M. Reyes Elizalde, Patrick J. McNally
Publikováno v:
Crystals, Vol 7, Iss 11, p 347 (2017)
The crack geometry and associated strain field around Berkovich and Vickers indents on silicon have been studied by X-ray diffraction imaging and micro-Raman spectroscopy scanning. The techniques are complementary; the Raman data come from within a f
Externí odkaz:
https://doaj.org/article/0c80f2efb40d40a9b98f046bdd099f78
Autor:
Patrick J. McNally, A.N. Danilewsky, E. Gorostegui-Colinas, J. Wittge, M. Reyes Elizalde, J. Garagorri, David Allen, Brian K. Tanner
Publikováno v:
Crystals, Vol 7, Iss 11, p 347 (2017)
Crystals; Volume 7; Issue 11; Pages: 347
Crystals, 2017, Vol.7(11), pp.347 [Peer Reviewed Journal]
Crystals; Volume 7; Issue 11; Pages: 347
Crystals, 2017, Vol.7(11), pp.347 [Peer Reviewed Journal]
The crack geometry and associated strain field around Berkovich and Vickers indents on silicon have been studied by X-ray diffraction imaging and micro-Raman spectroscopy scanning. The techniques are complementary, the Raman data coming from within a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::446cc8e6fc7ee60ec70c9c651bca64a8
https://doi.org/10.20944/preprints201710.0061.v1
https://doi.org/10.20944/preprints201710.0061.v1
Heterogeneous micromechanical properties of the extracellular matrix in healthy and infarcted hearts
Autor:
Daniel Navajas, M. Reyes Elizalde, Ramon Farré, Esther Melo, Ana Sancho, Ion Andreu, Tomas Luque, Beatriz Pelacho, Felipe Prosper, Olalla Iglesias-García
Publikováno v:
Acta biomaterialia. 10(7)
Infarcted hearts are macroscopically stiffer than healthy organs. Nevertheless, although cell behavior is mediated by the physical features of the cell niche, the intrinsic micromechanical properties of healthy and infarcted heart extracellular matri
Publikováno v:
Journal of Applied Physics
X-ray diffraction imaging of 200 mm diameter (100) oriented double-side polished silicon wafers has revealed that the slip band distribution, following rapid thermal annealing (RTA), has a lower symmetry than predicted from the material crystallograp
Autor:
José M. Sánchez, Barbara Miner, Tracey Scherban, Jose A. Maiz, B. Sun, José M. Martínez-Esnaola, Daniel Pantuso, Javier Gil-Sevillano, D. Gonzalez, Ibon Ocana, Jun He, G. Xu, M. Reyes Elizalde, Jon M. Molina
Publikováno v:
Scopus-Elsevier
A new testing technique for the characterization of the mechanical behavior of the interconnect structures of integrated circuit devices is introduced in this paper. Modified crosssectional nanoindentation (MCSN) is the result of extending cross-sect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03b9f3ef421998fd47f4dc636f2080cc
http://www.scopus.com/inward/record.url?eid=2-s2.0-84869842718&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-84869842718&partnerID=MN8TOARS
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