Zobrazeno 1 - 10
of 10
pro vyhledávání: '"M. R. Vanlandingham"'
Publikováno v:
Measurement Science and Technology. 16:2173-2185
Atomic force microscopy (AFM) was used to determine the three-dimensional geometry of instrumented indentation probes. From the AFM image data, the cross-sectional area, A, was determined as a function of the distance, hc, from the tip apex for a num
Publikováno v:
Journal of Polymer Science Part B: Polymer Physics. 43:1812-1824
Publikováno v:
Journal of Materials Science. 35:221-228
The microstructures generated by blends of linear low density polyethylene (LLDPE) and high density polyethylene (HDPE) following isothermal crystallization from the melt have been studied using several techniques. The traditional methods of electron
Publikováno v:
Journal of Applied Polymer Science. 71:787-798
The moisture diffusion process of an epoxy system is studied as a function of epoxy-amine stoichiometry and the resulting microstructure. Differences in diffusion behavior are related to the relative importance of diffusion through the low-density an
Publikováno v:
Journal of Applied Polymer Science. 71:699-712
Changes in microstructure and mechanical properties are investigated as a function of epoxy–amine stoichiometry. The epoxy–amine system studied exhibits a two-phase structure consisting of a hard microgel phase and a dispersed phase of soft, unre
Publikováno v:
Composites Part A: Applied Science and Manufacturing. 30:85-94
In Part 1 (the companion paper) a technique utilizing the indenting capabilities of the atomic force microscope (AFM) was used to evaluate the local changes in material response of polymer composite systems near the fiber–matrix interface. Response
Autor:
Steven H. McKnight, R. F. Eduljee, M. R. Vanlandingham, Travis A. Bogetti, Giuseppe R. Palmese, John W. Gillespie, J. R. Elings, Xiaogang Huang
Publikováno v:
The Journal of Adhesion. 64:31-59
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and woul
Autor:
R. F. Eduljee, Jr. R. L. McCULOUGH, John W. Gillespie, M. R. Vanlandingham, Giuseppe R. Palmese, Steven H. McKnight
Publikováno v:
Journal of Materials Science Letters. 16:117-119
Autor:
John W. Gillespie, Steven H. McKnight, Giuseppe R. Palmese, Roy L. McCullough, R. F. Eduljee, M. R. Vanlandingham
Publikováno v:
MRS Proceedings. 440
The atomic force microscope (AFM) has become a popular tool for characterizing surfaces of many different types of materials. In this paper, an AFM is used to probe the mechanical properties of polymer samples through examination of force curves prod
Autor:
Steven H. McKnight, R. F. Eduljee, John W. Gillespie, Travis A. Bogetti, Giuseppe R. Palmese, M. R. Vanlandingham
Publikováno v:
MRS Proceedings. 458
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this