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pro vyhledávání: '"M. R. Landau"'
Autor:
E. N. Hogert, M. R. Landau, M. F. Ruiz Gale, J. Marengo, N. G. Gaggioli, R. Dias Paiva, D. Soga, M. Muramatsu
Publikováno v:
Emerging Technologies in NDT ISBN: 9781003078586
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49feecfb6449e9c5f643d0072b920846
https://doi.org/10.1201/9781003078586-7
https://doi.org/10.1201/9781003078586-7
Publikováno v:
Insight - Non-Destructive Testing and Condition Monitoring. 45:263-265