Zobrazeno 1 - 10
of 23
pro vyhledávání: '"M. R. E. Bichara"'
Autor:
M. R. E. Bichara, J. P. R. Poitevin
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. :323-328
The aim of this work is to measure nondestructively the resistivity of a semiconductor in the form of an epitaxial layer. The method involves the measurements of the attenuation suffered by an electromagnetic wave reflected by a semiconducting surfac
Autor:
M. R. E. Bichara
Publikováno v:
Il Nuovo Cimento. 5:702-706
Si esaminano due oscillatori con transistore per poter dedurre statisticamente la loro precisione. Dai risultati si vede che stabilizzando voltaggio d’alimentazione la precisione viene portata da±0.005 5% a ±0.000 57% per l’oscillatore la cui f
Autor:
M. R. E. Bichara
Publikováno v:
Il Nuovo Cimento B Series 11. 9:453-455
A demonstration is given of the possibility to detect the minute and rapid changes in the length of a vibrating bar by means of a contactless probe followed by a relatively simple electronic circuit.
Publikováno v:
In Microelectronics Reliability 1969 8(1):64-64
Publikováno v:
Zeitschrift für angewandte Mathematik und Physik ZAMP. 23:1009-1009
Autor:
Arapov, Yu., Davydov, A.
Publikováno v:
Measurement Techniques; Aug1977, Vol. 20 Issue 8, p1214-1218, 5p
Autor:
Nanbu, S.
Publikováno v:
IEEE Transactions on Microwave Theory & Techniques; 1978, Vol. 26 Issue 3, p192-196, 5p
Autor:
Jovanovic, A.
Publikováno v:
Zeitschrift für Angewandte Mathematik und Physik (ZAMP); Nov1972, Vol. 23 Issue 6, p1009-1009, 1p
Publikováno v:
Zeitschrift für Angewandte Mathematik und Physik (ZAMP); Nov1972, Vol. 23 Issue 6, p1009-1009, 1p
Autor:
Brusa, R., Fröhlich, C.
Publikováno v:
Zeitschrift für Angewandte Mathematik und Physik (ZAMP); Nov1972, Vol. 23 Issue 6, p1009-1009, 1p