Zobrazeno 1 - 2
of 2
pro vyhledávání: '"M. Paz Cruz"'
Autor:
Eduardo A. Murillo‐Bracamontes, Juan J. Gervacio‐Arciniega, Edgar Cruz‐Valeriano, Christian I. Enríquez‐Flores, Martha A. Palomino‐Ovando, José M. Yañez‐Limón, Jesús M. Siqueiros, M. Paz Cruz
Publikováno v:
IET Science, Measurement & Technology, Vol 15, Iss 5, Pp 419-426 (2021)
Abstract Local characterizations of electric, magnetic, mechanical, electrochemical, and structural properties of materials by scanning probe microscopy (SPM) can be carried out by sensing variations of the contact cantilever's resonance frequencies,
Externí odkaz:
https://doaj.org/article/10e6c010ccaa497bb782f6ad5ea5b83f
Autor:
Juan J. Gervacio‐Arciniega, M. Paz Cruz, J. M. Yáñez-Limón, Jesús M. Siqueiros, C. I. Enriquez-Flores, E. Cruz-Valeriano, E. A. Murillo-Bracamontes, M. A. Palomino-Ovando
Publikováno v:
IET Science, Measurement & Technology, Vol 15, Iss 5, Pp 419-426 (2021)
Local characterizations of electric, magnetic, mechanical, electrochemical, and structural properties of materials by scanning probe microscopy (SPM) can be carried out by sensing variations of the contact cantilever's resonance frequencies, resultin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ec95397cac8bc5e11d79c64614659542
https://doi.org/10.1049/smt2.12042
https://doi.org/10.1049/smt2.12042