Zobrazeno 1 - 10
of 14
pro vyhledávání: '"M. P. Murrell"'
Autor:
R. Sakamoto, M. P. Murrell
Publikováno v:
Physical Review Research, Vol 6, Iss 3, p 033024 (2024)
Blebs, spherical membrane bulges of the cell membrane, are ubiquitous structures observed in various biological phenomena, including apoptosis, cell division, to bleb-based cell migration. The mechanics of blebbing have been characterized in terms of
Externí odkaz:
https://doaj.org/article/629e731507124a3fa4922c0cf5ceed5b
Autor:
T. Kiss, J. Wittenstein, C. Becker, K. Birr, G. Cinnella, E. Cohen, M. R. El Tahan, L. F. Falcão, C. Gregoretti, M. Granell, T. Hachenberg, M. W. Hollmann, R. Jankovic, W. Karzai, J. Krassler, T. Loop, M. J. Licker, N. Marczin, G. H. Mills, M. T. Murrell, V. Neskovic, Z. Nisnevitch-Savarese, P. Pelosi, R. Rossaint, M. J. Schultz, A. Serpa Neto, P. Severgnini, L. Szegedi, T. Vegh, G. Voyagis, J. Zhong, M. Gama de Abreu, M. Senturk, for the PROTHOR investigators, the Research Workgroup PROtective VEntilation Network (PROVEnet) of the European Society of Anaesthesiology (ESA)
Publikováno v:
Trials, Vol 20, Iss 1, Pp 1-20 (2019)
Abstract Background Postoperative pulmonary complications (PPC) may result in longer duration of in-hospital stay and even mortality. Both thoracic surgery and intraoperative mechanical ventilation settings add considerably to the risk of PPC. It is
Externí odkaz:
https://doaj.org/article/a028ba9822c84d12b4da9fbde717172a
Autor:
T. Kiss, J. Wittenstein, C. Becker, K. Birr, G. Cinnella, E. Cohen, M. R. El Tahan, L. F. Falcão, C. Gregoretti, M. Granell, T. Hachenberg, M. W. Hollmann, R. Jankovic, W. Karzai, J. Krassler, T. Loop, M. J. Licker, N. Marczin, G. H. Mills, M. T. Murrell, V. Neskovic, Z. Nisnevitch-Savarese, P. Pelosi, R. Rossaint, M. J. Schultz, A. Serpa Neto, P. Severgnini, L. Szegedi, T. Vegh, G. Voyagis, J. Zhong, M. Gama de Abreu, M. Senturk, for the PROTHOR investigators and the Research Workgroup PROtective VEntilation Network (PROVEnet) of the European Society of Anaesthesiology (ESA)
Publikováno v:
Trials, Vol 20, Iss 1, Pp 1-2 (2019)
After publication of the original article [1], the authors have notified us that two of the collaborator first and last names have been inverted in the “PROTHOR Investigators” table.
Externí odkaz:
https://doaj.org/article/285c4c2385d841dc951f1ec32b62c686
Publikováno v:
Biogeosciences, Vol 12, Iss 7, Pp 2063-2076 (2015)
The Louisiana shelf, in the northern Gulf of Mexico, receives large amounts of freshwater and nutrients from the Mississippi–Atchafalaya river system. These river inputs contribute to widespread bottom-water hypoxia every summer. In this study, we
Externí odkaz:
https://doaj.org/article/80f47dcce78f40cdac49f19eaa89385e
Autor:
Mark E. Welland, M. P. Murrell
Publikováno v:
Scanning. 15:251-256
This paper concerns the application of scanned probe microscopy to the study of thin silicon dioxide films. We show how the formation of 7 nm diameter silicon carbide particles on a silicon surface during high temperature processing affects the quali
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60cd2c00d754c1bb3583bb34b19553e0
https://doi.org/10.1002/sca.4950150503
https://doi.org/10.1002/sca.4950150503
Publikováno v:
Radiation Effects and Defects in Solids. 115:79-82
A semi-empirical model, based on concepts used to explain the process of track formation in insulators, has been applied to the experimental observation of improved film adhesion produced by MeV ion irradiation. Good agreement is obtained with experi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a14bc3b156976b4a35759727540a53a6
https://doi.org/10.1080/10420159008220556
https://doi.org/10.1080/10420159008220556
Autor:
J. R. Barnes, Mark E. Welland, A. C. F. Hoole, Bruno Michel, M. B. Johnson, H. Biebuyck, J.P. Bourgoin, M. P. Murrell, Alec N. Broers
Publikováno v:
Applied Physics Letters. 67:1538-1540
We used local probe techniques to characterize electron beam (e‐beam) induced changes in thin oxides on silicon. Primary effects of the 1 nm wide, 300 keV e beam included the formation of positive charges trapped in the SiO2, physical restructuring
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ef06835cb73b27a7a866ae5dfa8ff14
https://doi.org/10.1063/1.114485
https://doi.org/10.1063/1.114485
Autor:
SJ O'Shea, Mark E. Welland, M. P. Murrell, J. R. Barnes, Tmh Wong, AW McKinnon, Steven Verhaverbeke, Marc Heyns
Publikováno v:
Applied Physics Letters. 62:786-788
Using a modified atomic force microscope (AFM) with a conducting cantilever, we have investigated the dielectric strength of SiO2 gate oxide films. This has been achieved by spatially resolving the prebreakdown tunneling current flowing between the s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93c6b0a36ebe0109c6d2aeedf90e64d4
https://doi.org/10.1063/1.108579
https://doi.org/10.1063/1.108579
Publikováno v:
MRS Proceedings. 386
The use of Conducting Probe Atomic Force Microscopy to give nm scale electronic characterisation of surfaces is reviewed. Local conductance, Kelvin Probe work function measurements, Fowler-Nordheim tunnelling and local C-V characterisation techniques
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36d15e61754f65dc8f189ca0361c94b6
https://doi.org/10.1557/proc-386-371
https://doi.org/10.1557/proc-386-371
Publikováno v:
Extended Abstracts of the 1993 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98fea21410dcb1ac52dfa8667d72e2c1
https://doi.org/10.7567/ssdm.1993.s-iii-6
https://doi.org/10.7567/ssdm.1993.s-iii-6