Zobrazeno 1 - 10
of 249
pro vyhledávání: '"M. P. Murrell"'
Autor:
R. Sakamoto, M. P. Murrell
Publikováno v:
Physical Review Research, Vol 6, Iss 3, p 033024 (2024)
Blebs, spherical membrane bulges of the cell membrane, are ubiquitous structures observed in various biological phenomena, including apoptosis, cell division, to bleb-based cell migration. The mechanics of blebbing have been characterized in terms of
Externí odkaz:
https://doaj.org/article/629e731507124a3fa4922c0cf5ceed5b
Autor:
T. Kiss, J. Wittenstein, C. Becker, K. Birr, G. Cinnella, E. Cohen, M. R. El Tahan, L. F. Falcão, C. Gregoretti, M. Granell, T. Hachenberg, M. W. Hollmann, R. Jankovic, W. Karzai, J. Krassler, T. Loop, M. J. Licker, N. Marczin, G. H. Mills, M. T. Murrell, V. Neskovic, Z. Nisnevitch-Savarese, P. Pelosi, R. Rossaint, M. J. Schultz, A. Serpa Neto, P. Severgnini, L. Szegedi, T. Vegh, G. Voyagis, J. Zhong, M. Gama de Abreu, M. Senturk, for the PROTHOR investigators, the Research Workgroup PROtective VEntilation Network (PROVEnet) of the European Society of Anaesthesiology (ESA)
Publikováno v:
Trials, Vol 20, Iss 1, Pp 1-20 (2019)
Abstract Background Postoperative pulmonary complications (PPC) may result in longer duration of in-hospital stay and even mortality. Both thoracic surgery and intraoperative mechanical ventilation settings add considerably to the risk of PPC. It is
Externí odkaz:
https://doaj.org/article/a028ba9822c84d12b4da9fbde717172a
Autor:
T. Kiss, J. Wittenstein, C. Becker, K. Birr, G. Cinnella, E. Cohen, M. R. El Tahan, L. F. Falcão, C. Gregoretti, M. Granell, T. Hachenberg, M. W. Hollmann, R. Jankovic, W. Karzai, J. Krassler, T. Loop, M. J. Licker, N. Marczin, G. H. Mills, M. T. Murrell, V. Neskovic, Z. Nisnevitch-Savarese, P. Pelosi, R. Rossaint, M. J. Schultz, A. Serpa Neto, P. Severgnini, L. Szegedi, T. Vegh, G. Voyagis, J. Zhong, M. Gama de Abreu, M. Senturk, for the PROTHOR investigators and the Research Workgroup PROtective VEntilation Network (PROVEnet) of the European Society of Anaesthesiology (ESA)
Publikováno v:
Trials, Vol 20, Iss 1, Pp 1-2 (2019)
After publication of the original article [1], the authors have notified us that two of the collaborator first and last names have been inverted in the “PROTHOR Investigators” table.
Externí odkaz:
https://doaj.org/article/285c4c2385d841dc951f1ec32b62c686
Publikováno v:
Biogeosciences, Vol 12, Iss 7, Pp 2063-2076 (2015)
The Louisiana shelf, in the northern Gulf of Mexico, receives large amounts of freshwater and nutrients from the Mississippi–Atchafalaya river system. These river inputs contribute to widespread bottom-water hypoxia every summer. In this study, we
Externí odkaz:
https://doaj.org/article/80f47dcce78f40cdac49f19eaa89385e
Autor:
Faure, Laura M.1 (AUTHOR) lfaure@ibecbarcelona.eu, Gómez‐González, Manuel1 (AUTHOR), Baguer, Ona1,2 (AUTHOR), Comelles, Jordi1,3 (AUTHOR), Martínez, Elena1,3,4 (AUTHOR), Arroyo, Marino1,5,6,7 (AUTHOR), Trepat, Xavier1,2,4,8 (AUTHOR) xtrepat@ibecbarcelona.eu, Roca‐Cusachs, Pere1,2 (AUTHOR) proca@ibecbarcelona.eu
Publikováno v:
Advanced Science. 12/11/2024, Vol. 11 Issue 46, p1-12. 12p.
Autor:
Balasubramaniam, Lakshmi1,2 (AUTHOR), Jain, Shreyansh1,3 (AUTHOR), Dang, Tien1 (AUTHOR), Lagoutte, Emilie4 (AUTHOR), Marc Mège, René1 (AUTHOR), Chavrier, Philippe4 (AUTHOR) philippe.chavrier@curie.fr, Ladoux, Benoit1,5,6 (AUTHOR) benoit.ladoux@ijm.fr, Rossé, Carine1,4 (AUTHOR) carine.rosse@curie.fr
Publikováno v:
Advanced Science. 11/13/2024, Vol. 11 Issue 42, p1-10. 10p.
Autor:
Mark E. Welland, M. P. Murrell
Publikováno v:
Scanning. 15:251-256
This paper concerns the application of scanned probe microscopy to the study of thin silicon dioxide films. We show how the formation of 7 nm diameter silicon carbide particles on a silicon surface during high temperature processing affects the quali
Publikováno v:
Radiation Effects and Defects in Solids. 115:79-82
A semi-empirical model, based on concepts used to explain the process of track formation in insulators, has been applied to the experimental observation of improved film adhesion produced by MeV ion irradiation. Good agreement is obtained with experi
Autor:
J. R. Barnes, Mark E. Welland, A. C. F. Hoole, Bruno Michel, M. B. Johnson, H. Biebuyck, J.P. Bourgoin, M. P. Murrell, Alec N. Broers
Publikováno v:
Applied Physics Letters. 67:1538-1540
We used local probe techniques to characterize electron beam (e‐beam) induced changes in thin oxides on silicon. Primary effects of the 1 nm wide, 300 keV e beam included the formation of positive charges trapped in the SiO2, physical restructuring
Autor:
SJ O'Shea, Mark E. Welland, M. P. Murrell, J. R. Barnes, Tmh Wong, AW McKinnon, Steven Verhaverbeke, Marc Heyns
Publikováno v:
Applied Physics Letters. 62:786-788
Using a modified atomic force microscope (AFM) with a conducting cantilever, we have investigated the dielectric strength of SiO2 gate oxide films. This has been achieved by spatially resolving the prebreakdown tunneling current flowing between the s