Zobrazeno 1 - 10
of 16
pro vyhledávání: '"M. Ouahabi"'
Publikováno v:
2021 Sixth International Conference on Advances in Biomedical Engineering (ICABME).
Artificial Intelligence (AI) is significantly gaining interest in the field of Diagnostic and Functional Optical Imaging. As cutting-edge algorithms for decision-making are vast and medical imaging machines are diverse, the choice of the ultimate alg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f929471465b078f2a3f4ed441415be8
https://doi.org/10.1109/icabme53305.2021.9604812
https://doi.org/10.1109/icabme53305.2021.9604812
Publikováno v:
Journal de Physique III. 4:1659-1668
Nous presentons les recents progres realises au Laboratoire de Chimie Physique de l'Universite Paris 6 dans le domaine de l'optique X utilisant des multicouches gravees. Nous donnons des resultats concernant les reseaux d'amplitude multicouches, les
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c86d83301d97a3f2fba1552bee31fac9
https://doi.org/10.1051/jp3:1994231
https://doi.org/10.1051/jp3:1994231
Autor:
P. Guerin, C Khan Malek, Jean-Michel André, M. Ouahabi, F. R. Ladan, R. Barchewitz, R. Rivoira, A. Sammar
Publikováno v:
Journal of Optics. 24:37-41
The authors give a theoretical and experimental study of soft X-ray diffraction by a lamellar multilayer amplitude grating. Absolute efficiency measurements are obtained at 277 eV with a 1000 lines/mm grating etched in a Mo/C multilayer structure and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdcc01e341d7d84fe4135ed59e203177
https://doi.org/10.1088/0150-536x/24/1/008
https://doi.org/10.1088/0150-536x/24/1/008
Autor:
Pierre Boher, P. Troussel, R. Barchewitz, C. Senillou, J. C. Joud, Philippe Houdy, M. Ouahabi
Publikováno v:
SPIE Proceedings.
Carbon alternated with metallic elements such as Ni, Co, Cr, Rh, Fe, W, or Ti offers the best potentialities in terms of soft X-ray reflection in the range 44 - 100 A. Deposition of this type of device requires a very accurate control of nanometric f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::973118f70db09c16f7e7b41a1fc1784d
https://doi.org/10.1117/12.140569
https://doi.org/10.1117/12.140569
Autor:
A. Madouri, Yves Lepetre, M. Ouahabi, F. R. Ladan, R. Barchewitz, Chantal Khan Malek, Jean-Rene Rivoira, Jean Susini
Publikováno v:
Optical Engineering. 29:597
We report on the conception, fabrication, and characterization of a multilayer beamsplitter for use at oblique incidence in the soft x-ray range. Thin film deposition, conventional patterning, and anisotropic etch techniques are used to produce the s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8056b63f31666161f4e587db30864d7
https://doi.org/10.1117/12.55634
https://doi.org/10.1117/12.55634
Autor:
C. K. Malek, A. Madouri, R. Rivoira, F. R. Ladan, M. Ouahabi, J. Susini, R. Barchewitz, Yves Lepetre
Publikováno v:
SPIE Proceedings.
Large area multilayer beamsplitters (1 cm 2 ) were produced for use at oblique incidence in the soft X-ray range. Mo/C multilayer reflectors were deposited on top of a self supporting silicon carbide carrier film. The role of the supporting film and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::582f386cb7b9144e57d0108ce1d4f24e
https://doi.org/10.1117/12.962626
https://doi.org/10.1117/12.962626
Publikováno v:
SPIE Proceedings.
Conception, fabrication and characterization of a beamsplitter working in the soft X-ray range at oblique incidence are presented. A large area beamsplitter is fabricated using microfabrication technology and an inorganic film carrier. Reflectivity a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4607a14c87150f4360b9180808064a0
https://doi.org/10.1117/12.961851
https://doi.org/10.1117/12.961851
Publikováno v:
X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers.
We have observed that carbon tungsten multilayers smooth substrate surface defects at atomic scale. We have made experiments to understand what is the process responsible of this effect. We have realized silicon tungsten multilayer and carbon single
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0f42bf8141118eb5a961efd4f2d1803
https://doi.org/10.1117/12.948775
https://doi.org/10.1117/12.948775
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