Zobrazeno 1 - 6
of 6
pro vyhledávání: '"M. O'Flattery"'
Autor:
P. Zemlianoy, H.I. Rosten, T. Gautier, H. Vinke, M. O'Flattery, Clemens J. M. Lasance, C. Cahill, W. Temmerman, C. Lacaze, W. Nelemans, Y. Assouad, O. Slattery, John Parry
Publikováno v:
Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium.
The accurate prediction of the operating temperatures of critical electronic parts at the component-, board- and system-level is seriously hampered by the lack of reliable, standardised input data. This paper is the final report on the 3-year Europea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96375c1a8f3d0fc14d4825e9e17a3c2d
https://doi.org/10.1109/stherm.1997.566785
https://doi.org/10.1109/stherm.1997.566785
Conference
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Autor:
Joiner, B., Adams, V.
Publikováno v:
Fifteenth Annual IEEE Semiconductor Thermal Measurement & Management Symposium (Cat No99CH36306); 1999, p212-220, 9p
Publikováno v:
IEEE Transactions on Components, Packaging & Manufacturing Technology; Aug2011, Vol. 1 Issue 8, p1186-1194, 9p
Publikováno v:
Fourteenth Annual IEEE Semiconductor Thermal Measurement & Management Symposium (Cat No98CH36195); 1998, p31-38, 8p
Autor:
Karagol, Serap, Bikdash, Marwan
Publikováno v:
IEEE Transactions on Power Electronics; Apr2010, Vol. 25 Issue 4, p820-828, 9p, 2 Black and White Photographs, 3 Charts, 13 Graphs