Zobrazeno 1 - 5
of 5
pro vyhledávání: '"M. N. Metzner"'
Autor:
J. Dural, A. Audouard, M. N. Metzner, Ch. Dufour, M. Levalois, E. Paumier, Marcel Toulemonde, A. Hairie, J. P. Girard, François Beuneu
Publikováno v:
Radiation Effects and Defects in Solids. 126:181-184
(1993). High resistivity bismuth produced by heavy ion irradiations in the electronic stopping power regime. Radiation Effects and Defects in Solids: Vol. 126, No. 1-4, pp. 181-184.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92aa733cd70976e25dc28f025e8ddb7f
https://doi.org/10.1080/10420159308219704
https://doi.org/10.1080/10420159308219704
Publikováno v:
Radiation Effects and Defects in Solids. 126:261-264
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d4abaad85b951af95663fc33fd1ea79
https://doi.org/10.1080/10420159308219722
https://doi.org/10.1080/10420159308219722
Autor:
D. Julienne, E. Paumier, R. Carin, Marcel Toulemonde, M. N. Metzner, R. Madelon, M. Levalois, J. P. Girard, C. Dufour, A. Hairie, J. Dural, P. Bogdanski
Publikováno v:
Materials Science Forum. :599-604
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9c3d046e65380b1294a1a3cb4b3c534
https://doi.org/10.4028/www.scientific.net/msf.97-99.599
https://doi.org/10.4028/www.scientific.net/msf.97-99.599
Autor:
M. P. Chauvat, Pierre Ruterana, Yan Delorme, Bruno Guillet, Serguei Cherednichenko, Jean-Michel Krieg, R. Lefèvre, Ö. Arthursson, M.-N. Metzner, Laurence Méchin, Vladimir Drakinskiy
Publikováno v:
J Low Temp Phys
J Low Temp Phys, 2008, 151, pp.570-574
Journal of Low Temperature Physics
Journal of Low Temperature Physics, 2008, 151, pp.570-574. ⟨10.1007/s10909-007-9694-1⟩
J Low Temp Phys, 2008, 151, pp.570-574
Journal of Low Temperature Physics
Journal of Low Temperature Physics, 2008, 151, pp.570-574. ⟨10.1007/s10909-007-9694-1⟩
International audience; Various buffer layers have been investigated in order to improve the crystalline quality of NbN ultra-thin films. The structural properties, the thickness, the surface morphology of 5-10 nm NbN films have been studied by diffe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ae746bb554b8b78bf4677948fa7352e
https://cea.hal.science/cea-00372235
https://cea.hal.science/cea-00372235
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