Zobrazeno 1 - 10
of 72
pro vyhledávání: '"M. Meniconi"'
Publikováno v:
International Journal of Quality & Reliability Management, 1993, Vol. 10, Issue 7.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02656719310043760
Publikováno v:
Handbook of Adhesion Technology ISBN: 9783319420875
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bac63892afcc56e1059740de644b4335
https://doi.org/10.1007/978-3-319-42087-5_60-1
https://doi.org/10.1007/978-3-319-42087-5_60-1
Akademický článek
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Akademický článek
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Publikováno v:
Microelectronics Journal. 29:967-972
It has been known for some time that ionizing radiation has profound effects on integrated circuits. These need to be considered when such devices may be subjected to radiation environments, such as in the space and nuclear industries. As even the sp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04e91a0ad3d7593e0d58686081664f03
https://doi.org/10.1016/s0026-2692(97)00099-2
https://doi.org/10.1016/s0026-2692(97)00099-2
Publikováno v:
Microelectronics Reliability. 37:875-878
Performance degradation of operating parameters of integrated circuits has been known to increase with increasing total doses of ionizing radiation. It is the aim of this paper to demonstrate that, while these effects are cumulative, individual sub-c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9df75bc0946b2e865c41ad0eec89b43
https://doi.org/10.1016/s0026-2714(96)00279-x
https://doi.org/10.1016/s0026-2714(96)00279-x
Autor:
M. Meniconi
Publikováno v:
International Journal of Quality & Reliability Management. 14:301-308
Posits that most modern electronic equipment, particularly those involving metal‐oxide‐semiconductor technologies, are susceptible to electric overstresses which can cause performance degradation and lead to equipment failure. Probably the most p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a843748eaa702de888045c4ba02d2486
https://doi.org/10.1108/02656719710165509
https://doi.org/10.1108/02656719710165509
Publikováno v:
Disaster Prevention and Management: An International Journal. 6:33-42
Data sets were compiled from the MHIDAS data bank for incidents where there had been five or more fatalities, ten or more injuries, 50 evacuations, or US$1 million damage. The data were converted to magnitudes on the Bradford Disaster Scale and analy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::170b3612b81d6dfaa6a4c19f5b6fe296
https://doi.org/10.1108/09653569710162433
https://doi.org/10.1108/09653569710162433
Publikováno v:
International Journal of Quality & Reliability Management. 14:138-145
The degradation of both the functional and electrical parameter performance of integrated circuits has been under investigation for a number of years. Aims to demonstrate that statistical methods may be used to determine physical changes in these dev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::951d37e09b208ea3682dcbd037cb4245
https://doi.org/10.1108/02656719710165400
https://doi.org/10.1108/02656719710165400