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Autor:
M. Ye. Korniyenko, V. A. Makara, V. B. Shevchenko, M. M. Makhno, A. M. Korniyenko, T. S. Veblaya
Publikováno v:
physica status solidi c. 4:2131-2135
Different states of water and oxide layer in porous silicon (PS) have been studied by IR spectroscopy method. The water states have been shown to depend on contact conditions between PS and condensed or vaporous forms of water and to determine all th