Zobrazeno 1 - 10
of 57
pro vyhledávání: '"M. M. El-Gomati"'
Publikováno v:
Electron Microscopy and Analysis 1997 ISBN: 9781003063056
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::872a8d7e6edab93a22b405ec5ecb5443
https://doi.org/10.1201/9781003063056-68
https://doi.org/10.1201/9781003063056-68
Autor:
A.-K. Thamm, J. Wei, J. Zhou, C. G. H. Walker, H. Cabrera, M. Demydenko, D. Pescia, U. Ramsperger, A. Suri, A. Pratt, S. P. Tear, M. M. El-Gomati
Publikováno v:
Applied Physics Letters, 120 (5)
We simulate the electronic system of ejected electrons arising when a tip, positioned few 10 nm away from a surface, is operated in the field emission regime. We find that, by repeated quantum reflections (“quantum skipping”), electrons produced
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0cfda1ac22b27d49097970364066032c
Publikováno v:
Surface and Interface Analysis. 49:34-46
A new form of charged particle energy analyser is proposed. It is broadly based on the 180° magnetic spectrograph, but is intended to detect charged particles moving out of the dispersion plane with a helical motion. The analyser has the capability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6af43033b07c5307bc8a52d689134b94
https://doi.org/10.1002/sia.6055
https://doi.org/10.1002/sia.6055
Publikováno v:
Microscopy of Semiconducting Materials 2001 ISBN: 9781351074629
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8c55312e33ad5b7b1ac727022031e7d
https://doi.org/10.1201/9781351074629-93
https://doi.org/10.1201/9781351074629-93
Publikováno v:
Scanning. 30:2-15
The electron backscattering factor was measured from 24 different elements at low primary beam energy (250-5,000 eV). The results were compared with Monte Carlo simulations from a variety of freely available programs and an in-house developed program
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2977bf273a45c595d3dbea57b2f69801
https://doi.org/10.1002/sca.20091
https://doi.org/10.1002/sca.20091
Publikováno v:
Microelectronic Engineering. 87:1491-1493
This paper acts as an introduction to carbon nanotubes (CNTs). Chemical vapour deposition (CVD) is detailed together with a summary of their applications in electronics. Among the most promising applications is in field emission. The morphology can b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c2a83d2e85de1c4c82fde08635dd7f2
https://doi.org/10.1016/j.mee.2009.11.072
https://doi.org/10.1016/j.mee.2009.11.072
Publikováno v:
Review of Scientific Instruments. 70:2282-2287
This article describes a new kind of electrostatic charged particle analyzer capable of the parallel detection of a large kinetic energy range. The main purpose envisaged is for the simultaneous detection of electrons scattered from surfaces and havi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c073f7026e68585d7d8ecad082dac02e
https://doi.org/10.1063/1.1149753
https://doi.org/10.1063/1.1149753
Publikováno v:
Journal of Crystal Growth. 179:320-323
By using HBr H 3 PO 4 K 2 Cr 2 O 7 solution, bevels through InP-based structures were prepared. On InP/InGaAsP structure the bevel angles in the range 3 × 10 −5 to 2 × 10 −4 rad were obtained with good linearity of the bevel profile. The depend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::478f945c56094a13a1a6db7a68857aa4
https://doi.org/10.1016/s0022-0248(97)00176-0
https://doi.org/10.1016/s0022-0248(97)00176-0
Publikováno v:
Materials Science and Engineering: B. 47:127-130
By using H 3 PO 4 /H 2 O 2 /H 2 O etchant bevels through GaAs based structures were prepared. The bevels had angles lower than 5×10 −4 rad and good profile linearity. For the bevel surface observation optical interference microscopy was used.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d42bee255cdec85c419da4979bcfe3a1
https://doi.org/10.1016/s0921-5107(97)00024-x
https://doi.org/10.1016/s0921-5107(97)00024-x
Publikováno v:
Surface and Interface Analysis. 25:341-351
The statistical-weights Monte Carlo program of Cumpson for the calculation of depth distribution functions (DDF) has been extended in order to allow faster operation by use of a compiled language, C++, and the simulation of multilayer structures. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::708b9cfa36822d4490b71bb718debefd
https://doi.org/10.1002/(sici)1096-9918(199705)25:5<341::aid-sia242>3.0.co
https://doi.org/10.1002/(sici)1096-9918(199705)25:5<341::aid-sia242>3.0.co