Zobrazeno 1 - 10
of 44
pro vyhledávání: '"M. Lousberg"'
Autor:
Helen Yang, Haijin Zhu, Marco M. R. M. Hendrix, Niek J. H. G. M. Lousberg, Gijsbertus de With, A. Catarina C. Esteves, John H. Xin
Publikováno v:
Advanced Materials, 25(8), 1150-1154. Wiley-VCH Verlag
A sponge-like cotton fabric autonomously collects and releases water from fogs triggered by typical day-and-night temperature variations. The reversible switching between absorbing-superhydrophilic/releasing-superhydrophobic states results from struc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::181f958ed49fc04d76a380c048124b10
https://research.tue.nl/en/publications/d75282ba-e97b-42dc-8c68-898e17bf18ec
https://research.tue.nl/en/publications/d75282ba-e97b-42dc-8c68-898e17bf18ec
Autor:
Jeroen A. C. M. Goos, Cong D. Vo, Archan Dey, Chris J. van den Hoogen, Niek J. H. G. M. Lousberg, Marco M. R. M. Hendrix, Nicola Tirelli, Gijsbertus de With, Nico Sommerdijk
Publikováno v:
Zeitschrift für Kristallographie, 227, 739-743. Oldenbourg
The synthesis of a new class of hybrid materials with two differently oriented layers of calcite at adjacent sides of an organic template is demonstrated. A Langmuir monolayer of the amphiphilic block copolymer poly(butyl acrylate)-b-poly(hydroxyprop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c0e9d0a5aaa6a52b8693e5f230029682
https://doi.org/10.1524/zkri.2012.1525
https://doi.org/10.1524/zkri.2012.1525
Publikováno v:
Journal of Electronic Testing. 19:369-376
The ability to achieve and maintain high yield levels is directly dependent on the capability to detect and analyze repetitive failure mechanisms. In this paper, an advanced statistical diagnosis method, using the final wafer test results, is present
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b7a3ee984058ec420e1bb928243fd57
https://doi.org/10.1023/a:1024636424035
https://doi.org/10.1023/a:1024636424035
Autor:
Erik Jan Marinissen, M. Lousberg, Rohit Kapur, Mike Ricchetti, Yervant Zorian, Teresa McLaurin
Publikováno v:
Journal of Electronic Testing. 18:365-383
The increased usage of embedded pre-designed reusable cores necessitates a core-based test strategy, in which cores are tested as separate entities. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87224bfacdc974da45e0229ff57d3d19
https://doi.org/10.1023/a:1016585206097
https://doi.org/10.1023/a:1016585206097
Autor:
M. Lousberg, Joan Figueras, A.K. Maihi, D. Arumi, Rosa Rodriguez-Montanes, C. Hora, S. Eichenberger, B. Kruseman
Publikováno v:
VTS
Improvement of diagnosis methodologies is a key factor for fast failure analysis and yield improvement. As bridging defects are a common defect type in CMOS circuits, diagnosing this class of defect becomes relevant for present and future technologie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc8e5e5113f1059193b278313b20084b
https://doi.org/10.1109/vts.2007.27
https://doi.org/10.1109/vts.2007.27
Autor:
S. Einchenberger, Rosa Rodriguez-Montanes, M. Lousberg, B. Kruseman, Ananta K. Majhi, D. Arumi, Joan Figueras, C. Hora
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
VTS
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
VTS
Best Paper Award al millor article del congrés IEEE VLSI Test Symposium 2007 A proposal for enhancing the diagnosis of full open defects in interconnecting lines of CMOS circuits is presented. The defective line is first classified as fully opened b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20761a1ce3293ab8fcd1089faca1d932
http://hdl.handle.net/2117/7733
http://hdl.handle.net/2117/7733
Publikováno v:
Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005..
This paper presents the effectiveness of various stress conditions (mainly voltage and frequency) on detecting the resistive shorts and open defects in deep sub-micron embedded memories in an industrial environment. Simulation studies on very-low vol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d35d3e5014cb8473c6e898e96c67f7ea
https://doi.org/10.1109/esscir.2005.1541619
https://doi.org/10.1109/esscir.2005.1541619
Publikováno v:
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9054012f3c8909f531d3ae2212a66ce6
https://doi.org/10.1109/vtest.1999.766708
https://doi.org/10.1109/vtest.1999.766708
Publikováno v:
VTS
Resistive bridges not only cause a static faulty behavior in CMOS memories, but also lead to several dynamic faulty behaviors which are timing related failures. This paper introduces a new realistic dynamic fault model for random access-memories: the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79c2bce8f83476eadfabac5f51acafce
https://doi.org/10.1109/vts.2005.9
https://doi.org/10.1109/vts.2005.9
Publikováno v:
DATE
This paper presents the effectiveness of various stress conditions (mainly voltage and frequency) on detecting the resistive shorts and open defects in deep sub-micron embedded memories in an industrial environment. Simulation studies on very-low vol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27fbc7420f302843b464c989f1457cc7
https://doi.org/10.1109/date.2005.206
https://doi.org/10.1109/date.2005.206