Zobrazeno 1 - 5
of 5
pro vyhledávání: '"M. L. Malwah"'
Publikováno v:
Journal of Applied Physics. 46:2250-2256
In this paper we present the results of the pyromagnetic measurements on CoS2−xSex in the frequency range 100 Hz–10 MHz. The effect of the eddy current losses on the frequency response behavior is calculated and seems to explain the experimental
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9341ae34983d3f373ec67b8b995e7c61
https://doi.org/10.1063/1.321817
https://doi.org/10.1063/1.321817
Autor:
R. W. Bene, M. L. Malwah
Publikováno v:
Physical Review B. 6:3305-3315
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1c4fe205d3737173fb19b9726077869
https://doi.org/10.1103/physrevb.6.3305
https://doi.org/10.1103/physrevb.6.3305
Publikováno v:
AIP Conference Proceedings.
In this paper we present the results of the pyromagnetic measurements on CoS2−xSex single crystals in the frequency range of 100 Hz to 10 MHz. The high frequency response measurements reveal in these compounds the presence of a surface magnetic sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c5b35d325ca536f0d93547dd9201dd8
https://doi.org/10.1063/1.30148
https://doi.org/10.1063/1.30148
Publikováno v:
15th International Reliability Physics Symposium.
As the MOS technology goes toward increased density for dynamic RAM's, the use of two layers of polysilicon in a dual gate structure for the dynamic RAM cell appears to be the direction of new technologies. This paper describes a reliability problem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9c4a613a0dc6c0dec5f4b96684e52de
https://doi.org/10.1109/irps.1977.362767
https://doi.org/10.1109/irps.1977.362767
Publikováno v:
MRS Proceedings. 36
In this study, nucleation time has been found to play an important role in the three-step (Hi-Lo-Hi) intrinsic gettering process. The longer the nucleation time, the higher the density of oxygen precipitates and oxidation induced stacking faults. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f570a9f84fd1422cd24d9c51197b621
https://doi.org/10.1557/proc-36-239
https://doi.org/10.1557/proc-36-239