Zobrazeno 1 - 6
of 6
pro vyhledávání: '"M. L. Fel'shtyn"'
Publikováno v:
NAUCHNOE PRIBOROSTROENIE. 28:109-117
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5dda45a5598dba4c23eb20337ae83eec
https://doi.org/10.18358/np-28-3-i109117
https://doi.org/10.18358/np-28-3-i109117
Publikováno v:
AIP Conference Proceedings.
A simple design of optical and scanning probe microscopes combination is presented. To scan in the (X,Y)-plane a common piezo tube is used, but to coarse approach the probe to a sample surface and to scan the probe along the Z-axis a special original
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6141200c18ec67e5e6a736f2fc40b0a3
https://doi.org/10.1063/1.5087659
https://doi.org/10.1063/1.5087659
Autor:
S. Y. Lukashenko, M. L. Fel’shtyn, O. M. Gorbenko, I. D. Sapozhnikov, Ivan Mukhin, Alexander Golubok, Georgii Larionenko
Publikováno v:
AIP Conference Proceedings.
The nanomechanical oscillators (NMO) in the form of carbon nanowhiskers (CNW) with oval cross-sections have been created and studied in scanning-electron microscope (SEM). For measurement of amplitude-frequency characteristics of CNWs the methods of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78f5583bcb7ae890a88f5fe9a3418526
https://doi.org/10.1063/1.5087658
https://doi.org/10.1063/1.5087658
Publikováno v:
AIP Conference Proceedings.
We suggest the SPM module to combine SEM and SPM methods for studying surfaces. The module is based on the original mechanical moving and scanning system. The examples of studies of the steel surface microstructure in both SEM and SPM modes are prese
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22d32b4acad2a219337aa2877a511a96
https://doi.org/10.1063/1.4954338
https://doi.org/10.1063/1.4954338
Autor:
A. V. Lyutetsky, D. P. Khor’kov, A. O. Golubo, V. N. Trukhin, I. S. Tarasov, B. A. Matveyev, Nikita A. Pikhtin, M. L. Fel’shtyn, I. D. Sapozhnikov, L. L. Samoilov
Publikováno v:
Radiophysics and Quantum Electronics. 54:577-584
Carrier density distribution in various semiconductor microstructures is studied by means of a terahertz near-field microscope. The carrier density in the lightly doped p-InAsSbP(Zn) layer in an InAs-based sample is estimated.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c288d191060433610468606aabd546cc
https://doi.org/10.1007/s11141-012-9316-x
https://doi.org/10.1007/s11141-012-9316-x
Autor:
V. N. Trukhin, A. V. Trukhin, Alexander Golubok, L. L. Samoilov, V. A. Bykov, A. V. Andrianov, N. N. Zinov’ev, I. D. Sapozhnikov, M. L. Fel’shtyn
Publikováno v:
JETP Letters. 93:119-123
The mechanism of the interaction of coherent terahertz radiation with a probe-nanoobject system has been experimentally investigated in a terahertz apertureless near-field microscope. It has been found that the type of the material of a sample under
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5690c23942755c02a4e6bcec78289c44
https://doi.org/10.1134/s0021364011030179
https://doi.org/10.1134/s0021364011030179