Zobrazeno 1 - 3
of 3
pro vyhledávání: '"M. L. Breeding"'
Autor:
Edward P. Wilcox, Ronald D. Schrimpf, M. L. Breeding, Jonathan A. Pellish, Michael L. Alles, Megan C. Casey, Robert A. Reed
Publikováno v:
IEEE Transactions on Nuclear Science. 68:835-841
Single-event upsets are observed in a 72-layer 3-D NAND flash memory operated in a single-level cell mode after low-energy proton (500 keV–1.2 MeV) and heavy-ion irradiation. The layer-by-layer error count is analyzed to visualize the stopping of l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b15e04ef139f2a3e30b9ab08ddfab1f
https://doi.org/10.1109/tns.2021.3063156
https://doi.org/10.1109/tns.2021.3063156
Autor:
Christopher H. Bennett, Andrew M. Tonigan, David Russell Hughart, Matthew Marinella, Robert A. Weller, Robert A. Reed, Ronald D. Schrimpf, Joseph G. Salas, Madeline Esposito, Dolores A. Black, Michael Lee McLain, Dennis R. Ball, Jeffrey D. Black, M. L. Breeding
Publikováno v:
Proposed for presentation at the Radiation and its Effects on Components and Systems (RADECS) 2020 held October 19 - November 20, 2020 in Virtual, Virtual, Virtual..
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe83d646c854aeeaedd5ba44167752ce
https://doi.org/10.2172/1824738
https://doi.org/10.2172/1824738
Publikováno v:
IRPS
The complex vertical structures of 2.5D/3D integrated circuits present new challenges for the simulation, experimentation, and analysis of soft errors. Each added layer of circuitry in vertically integrated technologies increases the requirement for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6bd70246c06b161e3807fe9254d78fae
https://doi.org/10.1109/irps.2019.8720545
https://doi.org/10.1109/irps.2019.8720545