Zobrazeno 1 - 10
of 124
pro vyhledávání: '"M. Kopycinska-Müller"'
Publikováno v:
Nanotechnology. 28(35)
We confirmed the occurrence of phase transformations in an atomic force microscopy silicon tip during loading and unloading experiments performed on a polycrystalline Ti sample. The influence of the phase transformations on the effective mechanical a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30822653022d281353d3d9cacb2ad763
https://pubmed.ncbi.nlm.nih.gov/28650847
https://pubmed.ncbi.nlm.nih.gov/28650847
Akademický článek
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Publikováno v:
JOM. 59:23-29
Tools are being developed that use the atomic-force microscope (AFM) to measure mechanical properties with nanoscale spatial resolution. Contact-resonance-spectroscopy techniques such as atomic-force acoustic microscopy involve the vibrational modes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee0e749c774c8f516f6364ca47a0b839
https://doi.org/10.1007/s11837-007-0005-8
https://doi.org/10.1007/s11837-007-0005-8
Autor:
S. Mahajan, Ehrenfried Zschech, Bernd Köhler, N. Kuzeyeva, M. Kopycinska-Müller, Kong Boon Yeap, André Clausner, Klaus-Jurgen Wolter, T. Savage
Publikováno v:
Ultramicroscopy. 162
The indentation modulus of thin films of porous organosilicate glass with a nominal porosity content of 30% and thicknesses of 350 nm, 200 nm, and 46 nm is determined with help of atomic force acoustic microscopy (AFAM). This scanning probe microscop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f40d44e1777a456166e71c27915957a3
https://pubmed.ncbi.nlm.nih.gov/26799327
https://pubmed.ncbi.nlm.nih.gov/26799327
Publikováno v:
Applied Surface Science. 253:1274-1281
The effects of surface functionality and relative humidity (RH) on nanomechanical contact stiffness were investigated using atomic force acoustic microscopy (AFAM), a contact scanned-probe microscopy (SPM) technique. Self-assembled monolayers (SAMs)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ebbbdfddb80bd84243a8775aceb5cdf
https://doi.org/10.1016/j.apsusc.2006.01.072
https://doi.org/10.1016/j.apsusc.2006.01.072
Publikováno v:
Measurement Science and Technology. 16:2167-2172
We describe a dynamic atomic force microscopy (AFM) method for measuring the elastic properties of surfaces, thin films and nanostructures at the nanoscale. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa0fe257010bef40284e750608843448
https://doi.org/10.1088/0957-0233/16/11/006
https://doi.org/10.1088/0957-0233/16/11/006
Autor:
David T. Read, M. Kopycinska-Müller, J.E. Wright, Roy H. Geiss, Donna C. Hurley, A.S. Maxwell, Nigel M. Jennett, J. Müller
Publikováno v:
Journal of Materials Research. 20:1186-1193
The elastic properties of a nickel film approximately 800 nm thick were measured with nanoindentation, microtensile testing, atomic force acoustic microscopy (AFAM), and surface acoustic wave (SAW) spectroscopy. Values for the indentation modulus (22
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d21dd7b90a2d50c11fca98c1ea34c11
https://doi.org/10.1557/jmr.2005.0146
https://doi.org/10.1557/jmr.2005.0146
Publikováno v:
Nanotechnology. 16:703-709
Atomic force acoustic microscopy (AFAM), an emerging technique that affords nanoscale lateral and depth resolution, was employed to measure the elastic properties of ultrathin films. We measured the indentation modulus M of three nickel films approxi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3cf029a711da6d9e1e5cc5addde6b2ba
https://doi.org/10.1088/0957-4484/16/6/013
https://doi.org/10.1088/0957-4484/16/6/013
Publikováno v:
Acoustic Scanning Probe Microscopy ISBN: 9783642274930
This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), the basic theoretical models, the experimental techniques to obtain quantitative values of local elastic constants, and non-linear AFAM. Analytical and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::379dbfb4e78620d2a90d33f41f944782
https://doi.org/10.1007/978-3-642-27494-7_5
https://doi.org/10.1007/978-3-642-27494-7_5
Autor:
S. Hirsekorn, M. Kopycinska-Müller, Ute Rabe, Walter Arnold, Harald Natter, A. Caron, Rainer Birringer, Rolf Hempelmann
Atomic force acoustic microscopy (AFAM) is a near-field technique, where the vibration behavior of a micro-fabricated elastic cantilever beam in contact with a sample surface is sensitive to its local elastic properties. The resolution of this techni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7880764792353a480e911187e6eca7d5
https://publica.fraunhofer.de/handle/publica/215285
https://publica.fraunhofer.de/handle/publica/215285