Zobrazeno 1 - 10
of 17
pro vyhledávání: '"M. Kockert"'
Autor:
R. Mitdank, Anna Mogilatenko, H. Moon, Michael Kroener, M. Kockert, S. H. Moosavi, Wooyoung Lee, Jeongmin Kim, Saskia F. Fischer, Peter Woias
Publikováno v:
Nanoscale Advances. 3:263-271
We demonstrate the full thermoelectric and structural characterization of individual bismuth-based (Bi-based) core/shell nanowires. The influence of strain on the temperature dependence of the electrical conductivity, the absolute Seebeck coefficient
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d09ec924cc869b82681ed48ff7315825
https://doi.org/10.1039/d0na00658k
https://doi.org/10.1039/d0na00658k
Autor:
M, Kockert, R, Mitdank, H, Moon, J, Kim, A, Mogilatenko, S H, Moosavi, M, Kroener, P, Woias, W, Lee, S F, Fischer
Publikováno v:
Nanoscale advances. 3(1)
We demonstrate the full thermoelectric and structural characterization of individual bismuth-based (Bi-based) core/shell nanowires. The influence of strain on the temperature dependence of the electrical conductivity, the absolute Seebeck coefficient
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::42f64b40c5c4ee6ed16990bbaff0c46f
https://pubmed.ncbi.nlm.nih.gov/36131884
https://pubmed.ncbi.nlm.nih.gov/36131884
Autor:
M, Kockert, D, Kojda, R, Mitdank, A, Mogilatenko, Z, Wang, J, Ruhhammer, M, Kroener, P, Woias, S F, Fischer
Publikováno v:
Scientific Reports
Thermoelectric phenomena can be strongly modified in nanomaterials. The determination of the absolute Seebeck coefficient is a major challenge for metrology with respect to micro- and nanostructures due to the fact that the transport properties of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::e6919c80205ba756dce36454b9e14d65
https://pubmed.ncbi.nlm.nih.gov/31889097
https://pubmed.ncbi.nlm.nih.gov/31889097
The influence of size effects on the thermoelectric properties of thin platinum films is investigated and compared to the bulk. Structural properties, like the film thickness and the grain size, are varied. We correlate the electron mean free path wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b114e37e4772489c44f2a75388d79146
http://arxiv.org/abs/1903.12109
http://arxiv.org/abs/1903.12109
Autor:
Danny Kojda, Thorsten Hesjedal, Peter Woias, M. Kockert, S. Hoda Moosavi, Michael Kroener, Piet Schoenherr, Saskia F. Fischer
Publikováno v:
Proceedings, Vol 1, Iss 4, p 311 (2017)
We report on the functionality of our Thermoelectric Nanowire Characterization Platform (TNCP). As a proof of concept of our design, we present a set of experimental results obtained from the characterization of a single Bi2Te3 nanowire, allowing for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f28f59ddd44a94cf19bda945eb0351d
http://edoc.hu-berlin.de/18452/21125
http://edoc.hu-berlin.de/18452/21125
Publikováno v:
Nanomaterials, Vol 8, Iss 4, p 219 (2018)
Nanomaterials; Volume 8; Issue 4; Pages: 219
Nanomaterials
Nanomaterials; Volume 8; Issue 4; Pages: 219
Nanomaterials
In order to study the thermoelectric properties of individual nanowires, a thermoelectric nanowire characterization platform (TNCP) has been previously developed and used in our chair. Here, we report on a redesigned platform aiming to optimize perfo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::47fe136caf05ebfcb3c58770cd6acb38
https://doi.org/10.3390/nano8040219
https://doi.org/10.3390/nano8040219
Autor:
Klaus Rademann, Manfred Ramsteiner, Stefan Weidemann, Dirk Wallacher, Saskia F. Fischer, M. Kockert, Anna Mogilatenko
Publikováno v:
Journal of Nanomaterials, Vol 2015 (2015)
Silicon nanowires are prepared by the method of the two-step metal-assisted wet chemical etching. We have analyzed the structure of solid, rough and porous nanowire surfaces of boron-doped silicon substrates with resistivities of \rho > 1000 \Omega c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8ed42aa1e5aee74996657824513ffbd8
https://doaj.org/article/8850e9654c8146889d259ed7c9ed37be
https://doaj.org/article/8850e9654c8146889d259ed7c9ed37be
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