Zobrazeno 1 - 10
of 10
pro vyhledávání: '"M. K. Samokhvalov"'
Publikováno v:
Journal of Physics: Conference Series. 2056:012054
The development of methods and means of testing the applicability of thin-film electroluminescent indicator devices as displays in aircraft is carried out. Thin-film electroluminescent displays are used in equipment and systems that require high imag
Publikováno v:
Automation and Remote Control. 77:1093-1098
The actual task in the field of instrument making--automation of technological preparation of production of perspective thin-film electroluminescent (TFEL) indicators is considered. The main problems in the field is high labor-intensive characteristi
Publikováno v:
2014 IEEE 8th International Conference on Application of Information and Communication Technologies (AICT).
One of the most promising indicators is the thin film electroluminescent (TFEL) display device. Design and research processes of the TFEL devices are associated with high calculation complexity, settlement slowness, as well as with a large amount of
Publikováno v:
2014 International Conference on Actual Problems of Electron Devices Engineering (APEDE).
Autor:
M. O. Takhtenkova, M. K. Samokhvalov
Publikováno v:
Semiconductors. 44:1634-1636
Brightness-voltage characteristics, the voltage dependence of the luminous efficiency, and the photoluminescence spectra of ZnS:Mn luminescent films produced by thermal and electron-beam evaporation have been studied. Specific features of their prope
Autor:
M. K. Samokhvalov
Publikováno v:
Journal of Applied Spectroscopy. 62:555-558
Thin-film electroluminescent (TEL) structures of the metal-dielectric-luminophor-dielectric-transparent electrode type are the most promising devices for the creation of emission sources. In order to elucidate the processes of energy conversion into
Autor:
M. K. Samokhvalov, R. R. Davydov
Publikováno v:
Technical Physics Letters. 28:1049-1051
A method for determining the concentration and electron-impact excitation cross section of activated emission centers in the phosphor layer of a thin-film electroluminescent capacitor structure, based on measurements of the brightness as a function o
Autor:
M. K. Samokhvalov, E. B. Ryabinov
Publikováno v:
Journal of Applied Spectroscopy. 58:381-384
Publikováno v:
Technical Physics Letters. 27:341-343
A new method is proposed for determining the parameters of emission centers in the luminophor layer of a ZnS-based thin-film electroluminescent display. The method was experimentally verified to yield correct values of the activator concentration and
Autor:
E. E. Zabudskii, M. K. Samokhvalov
Publikováno v:
Technical Physics Letters. 26:29-30
The pattern of luminance waves in thin-film electroluminescent structures was modeled and the duration of transient lighting processes in these systems was determined. A principle of the indicator display control is formulated which provides for a ma