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pro vyhledávání: '"M. J. McClorey"'
Autor:
Mark W. Coffey, M. J. McClorey, S. M. Schwarzbek, E. K. Moser, W. J. Tomasch, Jacek K. Furdyna, C. L. Pettiette-Hall
Publikováno v:
Physical Review B. 49:4199-4208
Microwave transmission and reflection measurements are performed simultaneously on thin films (\ensuremath{\sim}1800 \AA{}) of ${\mathrm{YBa}}_{2}$${\mathrm{Cu}}_{3}$${\mathrm{O}}_{7\mathrm{\ensuremath{-}}\mathit{x}}$ having their c axis perpendicula
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a8f50e3cf0ec3f3a1852369ca828a3e
https://doi.org/10.1103/physrevb.49.4199
https://doi.org/10.1103/physrevb.49.4199
