Zobrazeno 1 - 5
of 5
pro vyhledávání: '"M. I. Mazuritsky"'
Autor:
V. V. Shapovalov, L. V. Guda, Antonina N. Kravtsova, M. V. Kirichkov, Alexander V. Soldatov, M. I. Mazuritsky, Yu. V. Rusalyov, Stanislav P. Kubrin
Publikováno v:
Journal of Structural Chemistry. 59:1858-1865
A comprehensive study of the Jiddat Al Harasis 055 (L4-5 type) ordinary chondrite is conducted using 2D X-ray fluorescence spectroscopy, Mossbauer spectroscopy, X-ray absorption near edge structure (XANES) spectroscopy, X-ray diffraction, and vibrati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e5fe2f640f55856a0f86598a652fbec
https://doi.org/10.1134/s0022476618080140
https://doi.org/10.1134/s0022476618080140
Autor:
E. M. Latush, M. I. Mazuritsky, V. L. Lyashenko, Alexander V. Soldatov, Augusto Marcelli, S. I. Shevtsova, A. T. Kozakov
Publikováno v:
Technical Physics Letters. 27:11-13
An electron-probe X-ray microanalyzers, the characteristic X-ray radiation is generated within a small volume of sample and the emitting surface area is on the order of 1 μm2. For a distance to analyzer of approximately 0.5 m, this small emitting ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5872aebe3808921f6cb7aea7588c3aa
https://doi.org/10.1134/1.1345153
https://doi.org/10.1134/1.1345153
Autor:
Alexander V. Soldatov, Augusto Marcelli, G. A. Ugol’nitskii, M. I. Mazuritsky, V. L. Lyashenko, E. M. Latush
Publikováno v:
Scopus-Elsevier
Three possible schemes of a high-resolution stepped X-ray diffractor have been analyzed, including those based on the steps of equal angular widths, the steps of equal heights (i.e., distances from the step edge to the beginning of the next step), an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1c748dece758f818dc8624c5801b5e1
https://doi.org/10.1134/1.1262891
https://doi.org/10.1134/1.1262891
A novel type of x-ray diffractor besed on a pseudo-spherical stepped geometry is proposed. Theoretica parameters of three possible devices based on this geometry, a high-resolution 'post' monochromator for spin-dpendent x-ray absorption, a x-ray micr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25afc6e455e6d28272f324e2a2db0a89
Autor:
E. M. Latush, M. I. Mazuritsky
Publikováno v:
Technical Physics Letters. 28:21-22
Dependence of the spectral resolution of a focusing X-ray diffractor on the shape of the reflecting crystallographic planes was theoretically studied in the point source approximation. An analytical expression describing the resolution as a function
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e4d3a2269f63af8f819cdcea0add39e
https://doi.org/10.1134/1.1448631
https://doi.org/10.1134/1.1448631