Zobrazeno 1 - 10
of 100
pro vyhledávání: '"M. Heinitz"'
Autor:
Sarah J. Becker, André T. Nemat, Simon Lucas, René M. Heinitz, Manfred Klevesath, Jean Enno Charton
Publikováno v:
AI & SOCIETY.
The rapid and dynamic nature of digital transformation challenges companies that wish to develop and deploy novel digital technologies. Like other actors faced with this transformation, companies need to find robust ways to ethically guide their inno
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6d134c832de6df3a66c9e70b08d5109
https://doi.org/10.1007/s00146-021-01376-w
https://doi.org/10.1007/s00146-021-01376-w
Autor:
S. Perryck, M. Zamburlini, C. Linsenmeier, G. Matthias, M. Heinitz, A. Moreira, I. Pytko, Stephanie Tanadini-Lang
Publikováno v:
Radiotherapy and Oncology. 152:S1025
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0293a67770a6540b1a80adc4e2ef94f8
https://doi.org/10.1016/s0167-8140(21)01857-0
https://doi.org/10.1016/s0167-8140(21)01857-0
Autor:
M. Heinitz
Publikováno v:
Erfahrungsheilkunde. 50:393-399
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf4e17fa62f327851a0eca5210a245f6
https://doi.org/10.1055/s-2001-16172
https://doi.org/10.1055/s-2001-16172
Autor:
Wojciech Maly, M. Huber, M. Heinitz, J. Gstöttner, D. Schmitt-Landsiedel, Th. Zanon, Th. Nirschl
Publikováno v:
Microelectronics Reliability. 40:1635-1640
New kinds of faults in digital ICs caused by particles with a certain resistance value are presented. By using an enhanced version of a three dimensional contamination-defect-fault simulator the faulty circuit behaviour caused by these defects and ap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfc09d06897871f9367086268ec7cebb
https://doi.org/10.1016/s0026-2714(00)00183-9
https://doi.org/10.1016/s0026-2714(00)00183-9
Publikováno v:
Proceedings EURO-DAC '92: European Design Automation Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52da3c674cffe080c5792409b38e93eb
https://doi.org/10.1109/eurdac.1992.246199
https://doi.org/10.1109/eurdac.1992.246199
Publikováno v:
VTS
This paper presents an I/sub DDQ/ test generation system for scan-based circuits, called CURRENT. A library-based fault modeling strategy is used to specify a realistic target fault set, which encompasses intra-gate shorts (for example stuck-on fault
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec6bc6b4361022cbcf06585ab32e31f3
https://doi.org/10.1109/vtest.1995.512655
https://doi.org/10.1109/vtest.1995.512655
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
M, Heinitz
Publikováno v:
ZFA. Zeitschrift fur Allgemeinmedizin. 57(9)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::bf79ede72e4dd7129e53c292ed10949c
https://pubmed.ncbi.nlm.nih.gov/6165158
https://pubmed.ncbi.nlm.nih.gov/6165158
Autor:
M, Heinitz
Publikováno v:
Das Offentliche Gesundheitswesen. 47(5)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::710d2776e46e7fc57a58053d8be82661
https://pubmed.ncbi.nlm.nih.gov/2989747
https://pubmed.ncbi.nlm.nih.gov/2989747
Autor:
M, Heinitz
Publikováno v:
Die Medizinische Welt. 28(13)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::a2359f1377238fd18a0f00036989fd84
https://pubmed.ncbi.nlm.nih.gov/853928
https://pubmed.ncbi.nlm.nih.gov/853928