Harmonized in situ datasets for agricultural land use mapping and monitoring in tropical countries

Autor: A. Jolivot, V. Lebourgeois, L. Leroux, M. Ameline, V. Andriamanga, B. Bellón, M. Castets, A. Crespin-Boucaud, P. Defourny, S. Diaz, M. Dieye, S. Dupuy, R. Ferraz, R. Gaetano, M. Gely, C. Jahel, B. Kabore, C. Lelong, G. le Maire​​​​​​​, D. Lo Seen, M. Muthoni, B. Ndao, T. Newby, C. L. M. de Oliveira Santos, E. Rasoamalala, M. Simoes, I. Thiaw, A. Timmermans, A. Tran, A. Bégué

Publikováno v: Earth System Science Data, Vol 13, Pp 5951-5967 (2021)

The availability of crop type reference datasets for satellite image classification is very limited for complex agricultural systems as observed in developing and emerging countries. Indeed, agricultural land use is very dynamic, agricultural censuse

Externí odkaz: https://doaj.org/article/9eeb9d76d10f4c3196779cc5b9778e6d

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Performance and Modeling of Si-Nanocrystal Double-Layer Memory Devices With High- $k$ Control Dielectrics

Autor: G. Gay, G. Molas, M. Bocquet, E. Jalaguier, M. Gely, L. Masarotto, J. P. Colonna, H. Grampeix, F. Martin, P. Brianceau, V. Vidal, R. Kies, T. Baron, G. Ghibaudo, B. De Salvo

Publikováno v: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.933-940. ⟨10.1109/TED.2012.2182769⟩
IEEE Transactions on Electron Devices, 2012, 59 (4), pp.933-940. ⟨10.1109/TED.2012.2182769⟩

In this paper, memory devices integrating a double layer of silicon nanocrystals (Si-ncs) as a trapping medium and a HfAlO-based control dielectrics are presented. We will show that the use of two stacked Si-nc layers significantly improves the memor

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e825636024ee58517081533b61029f2
https://doi.org/10.1109/ted.2012.2182769

Very-high-frequency probes for atomic force microscopy with silicon optomechanics

Autor: L. Schwab, P. E. Allain, N. Mauran, X. Dollat, L. Mazenq, D. Lagrange, M. Gély, S. Hentz, G. Jourdan, I. Favero, B. Legrand

Publikováno v: Microsystems & Nanoengineering, Vol 8, Iss 1, Pp 1-14 (2022)

Abstract Atomic force microscopy (AFM) has been consistently supporting nanosciences and nanotechnologies for over 30 years and is used in many fields from condensed matter physics to biology. It enables the measurement of very weak forces at the nan

Externí odkaz: https://doaj.org/article/be26b9d481b84e2ba0dd6fd34846fdde

Physical Properties of Quinoa Seeds

Autor: M. Gely, E. Santalla, C. Vilche

Publikováno v: Biosystems Engineering. 86:59-65

Physical properties of quinoa (Chenopodium quinoa Willd.) seeds were determined as a function of moisture content. In the moisture range from to 4·6 to 25·8% dry basis, the 1000-seed mass increased from to 2·5 to 3·1 g, the sphericity from 0·77

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2aa257f9283118552036b68ed1f5366c
https://doi.org/10.1016/s1537-5110(03)00114-4