Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Large SET Duration Broadening in a Fully-Depleted SOI Technology—Mitigation With Body Contacts

Autor: Daisuke Kobayashi, O. Flament, Dale McMorrow, Hirokazu Ikeda, Veronique Ferlet-Cavrois, Kazuyuki Hirose, J.R. Schwank, M. Gaillardin

Publikováno v: IEEE Transactions on Nuclear Science. 57:1811-1819

Significant floating body effects were measured in 0.2 μm fully-depleted SOI resulting in large amounts of single event transient (SET) broadening, i.e., SET duration stretching. The transient response of single transistors and the propagation of si

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9be5bd36ede0cd96d0c44e17d7d9c338
https://doi.org/10.1109/tns.2010.2048927

Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains

Autor: M. Gaillardin, Marty R. Shaneyfelt, F. Essely, V.F. Cavrois, Vincent Pouget, Joseph S. Melinger, Dale McMorrow, N. Fel, P. Paillet, Daisuke Kobayashi, J.R. Schwank, Richard S. Flores, Olivier Duhamel, Paul E. Dodd

Publikováno v: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.2842-2853
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2008, 55 (6), pp.2842-2853

The propagation of single event transients (SET) is measured and modeled in SOI and bulk inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to determine the SET pulse width measured at the output of long chains of invert

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8a24bd79a1ed5719e68a64fcfae1288f
https://doi.org/10.1109/tns.2008.2007724

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.