Zobrazeno 1 - 4
of 4
pro vyhledávání: '"M. G. Gottwald"'
Autor:
G. Hu, C. Safranski, J. Z. Sun, P. Hashemi, S. L. Brown, J. Bruley, L. Buzi, C. P. D'Emic, E. Galligan, M. G. Gottwald, O. Gunawan, J. Lee, S. Karimeddiny, P. L. Trouilloud, D. C. Worledge
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6436168d7a3f387d76e47182722b1aa
https://doi.org/10.1109/iedm45625.2022.10019402
https://doi.org/10.1109/iedm45625.2022.10019402
Autor:
D. C. Worledge, C. Safranski, G. Hu, J. Z. Sun, P. Hashemi, S. L. Brown, L. Buzi, C. P. D'Emic, M. G. Gottwald, O. Gunawan, H. Jung, S. Karimeddiny, J. Kim, P. L. Trouilloud
Publikováno v:
2022 IEEE 33rd Magnetic Recording Conference (TMRC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7e0105281b63c8529862d42506644fa
https://doi.org/10.1109/tmrc56419.2022.9918607
https://doi.org/10.1109/tmrc56419.2022.9918607
Autor:
C. Safranski, G. Hu, J. Z. Sun, P. Hashemi, S. L. Brown, L. Buzi, C. P. D'Emic, E. R. J. Edwards, E. Galligan, M. G. Gottwald, O. Gunawan, S. Karimeddiny, H. Jung, J. Kim, K. Latzko, P. L. Trouilloud, S. Zare, D. C. Worledge
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f031dfcb76a11da30c1ae58d7e40861
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830306
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830306
Autor:
G. Hu, G. Lauer, J. Z. Sun, P. Hashemi, C. Safranski, S. L. Brown, L. Buzi, E. R. J. Edwards, C. P. D'Emic, E. Galligan, M. G. Gottwald, O. Gunawan, H. Jung, J. Kim, K. Latzko, J. J. Nowak, P. L. Trouilloud, S. Zare, D. C. Worledge
Publikováno v:
2021 IEEE International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8d2744883bf60d4284ab3d5976e9553
https://doi.org/10.1109/iedm19574.2021.9720691
https://doi.org/10.1109/iedm19574.2021.9720691