Zobrazeno 1 - 10
of 32
pro vyhledávání: '"M. Elert"'
Publikováno v:
Surface and Coatings Technology. :170-175
Nanocrystalline Al2O3 layers were produced by means of impulse plasma deposition (IPD) technique on Si and SiC substrates. Morphology, microstructure and chemical composition of films and film/substrate interfaces were investigated using SEM and SIMS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c5bc4a71b1486df084e8539aec251f8
https://doi.org/10.1016/s0257-8972(03)00527-9
https://doi.org/10.1016/s0257-8972(03)00527-9
Autor:
Marsha I. Sheppard, Adrian P. Butler, W. Raskob, M. Elert, O. Edlund, Gerald Kirchner, J. Chen, Almudena Agüero
Publikováno v:
Journal of Environmental Radioactivity. 42:271-288
Increasingly the burial of nuclear waste in deep underground repositories is being regarded as a safe long-term solution for disposal. However, to support this safety assessment models of the associated risks are required. An important component of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::524d9c0085044fb7ae33332a63801b01
https://doi.org/10.1016/s0265-931x(98)00059-9
https://doi.org/10.1016/s0265-931x(98)00059-9
Autor:
A. Golubenkov, O. Togawa, J. Chen, M. Elert, Alexei Konoplev, T. Zeevaert, C. Dovlete, Adrian P. Butler, Marsha I. Sheppard
Publikováno v:
Journal of Environmental Radioactivity. 42:255-270
In the Model Complexity working group of BIOMOVS II, models of varying complexity have been applied to a theoretical problem concerning downward transport of radionuclides in soils. The purpose was to study how uncertainty in model predictions varies
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eda19058c19a8e35265008ac069599e5
https://doi.org/10.1016/s0265-931x(98)00058-7
https://doi.org/10.1016/s0265-931x(98)00058-7
Publikováno v:
Cement and Concrete Research. 22:477-488
To assess the safety of radioactive waste disposal, knowledge and understanding of radionuclide migration mechanisms must be improved. The long time scale leachability of cement-based waste forms is considered, comparing mathematical modelling and re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7d36e4dd33a12871d317a15f9e620d6
https://doi.org/10.1016/0008-8846(92)90091-9
https://doi.org/10.1016/0008-8846(92)90091-9
Autor:
M. Elert, K. Skagius
Publikováno v:
International Journal of Radioactive Materials Transport. 1:151-161
In Sweden, air transport is considered as an alternative for the shipment of uranium hexafluoride (UF6). The radiological consequences of an aeroplane accident involving UF6, transport have been estimated and are presented as the dose from acute expo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a082588a877cafa60d809e02517afef3
https://doi.org/10.1179/rmt.1990.1.3.151
https://doi.org/10.1179/rmt.1990.1.3.151
Akademický článek
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Publikováno v:
3rd International Conference 'Novel Applications of Wide Bandgap Layers' Abstract Book (Cat. No.01EX500).
The authors study TiO/sub 2/ layers produced by Reactive Pulse Plasma (RPP) deposition on semiconductor substrates. The layers have been investigated both in terms of structure and electrophysical properties. The thickness and refractive index, the s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da2baa14e35f0473623dd7da538de71b
https://doi.org/10.1109/wbl.2001.946608
https://doi.org/10.1109/wbl.2001.946608
Publikováno v:
3rd International Conference 'Novel Applications of Wide Bandgap Layers' Abstract Book (Cat. No.01EX500).
Summary form only given. The investigations concern Al/sub 2/O/sub 3/ layers produced by the reactive pulse plasma (RPP) method on semiconductor substrates (Si, SiC). The layers have been investigated both in terms of structure and electrophysical pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55d95e30a201c0fda899abf7b8d716c1
https://doi.org/10.1109/wbl.2001.946602
https://doi.org/10.1109/wbl.2001.946602
Autor:
Krzysztof Zdunek, M. Elert
Publikováno v:
3rd International Conference 'Novel Applications of Wide Bandgap Layers' Abstract Book (Cat. No.01EX500).
Silicon carbide is a wide band gap semiconductor material. Although it has been known for several years, investigators continue to examine it in fundamental as well as application terms. SiC is used in devices operated under high-power, high temperat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b4e985d625575ca191f20a4df829259
https://doi.org/10.1109/wbl.2001.946560
https://doi.org/10.1109/wbl.2001.946560
Akademický článek
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