Zobrazeno 1 - 10
of 40
pro vyhledávání: '"M. David Henry"'
Autor:
Samantha T. Jaszewski, Eric R. Hoglund, Anna Costine, Marc H. Weber, Shelby S. Fields, Maria Gabriela Sales, Jaykumar Vaidya, Leah Bellcase, Katie Loughlin, Alejandro Salanova, Diane A. Dickie, Steven L. Wolfley, M. David Henry, Jon-Paul Maria, Jacob L. Jones, Nikhil Shukla, Stephen J. McDonnell, Petra Reinke, Patrick E. Hopkins, James M. Howe, Jon F. Ihlefeld
Publikováno v:
Acta Materialia. 244:118567
Autor:
Samantha T. Jaszewski, Eric R. Hoglund, Anna Costine, Marc H. Weber, Shelby S. Fields, Maria Gabriela Sales, Jaykumar Vaidya, Leah Bellcase, Katie Loughlin, Alejandro Salanova, Diane A. Dickie, Steven L. Wolfley, M. David Henry, Jon-Paul Maria, Jacob L. Jones, Nikhil Shukla, Stephen J. McDonnell, Petra Reinke, Patrick E. Hopkins, James M. Howe, Jon F. Ihlefeld
Publikováno v:
Acta Materialia. 239:118220
Publikováno v:
Semiconductor Technologies
In this chapter, we have described and explored some of the emerging plasma applications of etching, deposition, and surface modification to semiconductor materials. The process latitude available in modern ICP-RIE systems has enabled these novel pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::25614914468027dd19ec04de071ecf61
http://www.intechopen.com/articles/show/title/advanced-plasma-processing-etching-deposition-and-wafer-bonding-techniques-for-semiconductor-applica
http://www.intechopen.com/articles/show/title/advanced-plasma-processing-etching-deposition-and-wafer-bonding-techniques-for-semiconductor-applica
Autor:
Michael T. Brumbach, John F. Conley, Melanie A. Jenkins, M. David Henry, Konner E. K. Holden, Joseph C. Woicik, Samantha T. Jaszewski, Jon F. Ihlefeld, Sean W. Smith, Conan Weiland
Publikováno v:
ACS applied materialsinterfaces. 13(12)
Doped ferroelectric HfO2 is highly promising for integration into complementary metal-oxide semiconductor (CMOS) technology for devices such as ferroelectric nonvolatile memory and low-power field-effect transistors (FETs). We report the direct measu
Autor:
Jordan E. Gutierrez, John Mudrick, Shawn Arterburn, T. A. Friedmann, Lisa Caravello, Jonatan A. Sierra Suarez, Matthew B. Jordan, Crystal C. Sennett, M. David Henry
Publikováno v:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC).
In this study we examine a split-foundry multilevel application specific integrated circuit (ASIC) Si-interposer and die bonded using the direct bond interface (DBI) process, in addition to shortloop vehicles. The designs have been subject to relaxed
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Chris M. Fancher, Paul Davids, M. David Henry, Patrick E. Hopkins, Diane A. Dickie, Giovanni Esteves, David H. Olson, Shelby S. Fields, Jon F. Ihlefeld, Sean W. Smith, Samantha T. Jaszewski
Publikováno v:
Applied Physics Letters. 119:129901
Autor:
Nancy A. Missert, Matthäus A. Wolak, M. David Henry, Erik P. DeBenedictis, Michael P. Frank, Rupert Lewis
Publikováno v:
2019 IEEE International Superconductive Electronics Conference (ISEC).
In an ongoing project at Sandia National Laboratories, we are attempting to develop a novel style of superconducting digital processing, based on a new model of reversible computation called Asynchronous Ballistic Reversible Computing (ABRC). We envi
Autor:
Matthew B. Jordan, John Mudrick, Jonatan A. Sierra-Suarez, T. A. Friedmann, Robert L. Jarecki, M. David Henry
Publikováno v:
2019 IEEE 69th Electronic Components and Technology Conference (ECTC).
Direct bond interconnect (DBI) processes enable chip to chip, low resistivity electrical connections for 2.5-D scaling of electrical circuits and heterogenous integration. This work describes SiO2/Cu DBI technology with Cu interconnect performance in
Autor:
M. David Henry, Chris M. Fancher, David H. Olson, Paul Davids, Giovanni Esteves, Diane A. Dickie, Samantha T. Jaszewski, Jon F. Ihlefeld, Sean W. Smith, Shelby S. Fields, Patrick E. Hopkins
Publikováno v:
Applied Physics Letters. 118:102901
The elastic moduli of amorphous and crystalline atomic layer-deposited Hf1-xZrxO2 (HZO, x = 0, 0.31, 0.46, 0.79, 1) films prepared with TaN electrodes on silicon substrates were investigated using picosecond acoustic measurements. The moduli of the a