Zobrazeno 1 - 7
of 7
pro vyhledávání: '"M. D. Antonik"'
Publikováno v:
Surface and Interface Analysis. 24:681-686
The clean single-crystal VC 0.75 (100) surface, its oxidation, and the stability of the resulting oxide were examined with electron spectroscopy (AES, XPS and UPS), electron diffraction (low-energy and reflection high energy electron diffraction) and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d64f69de8771ffba508e664de2e73dc9
https://doi.org/10.1002/(sici)1096-9918(19960930)24:10<681::aid-sia179>3.0.co
https://doi.org/10.1002/(sici)1096-9918(19960930)24:10<681::aid-sia179>3.0.co
Publikováno v:
Thin Solid Films. 256:247-252
The microstructure of 50 nm thick WO3 films used in surface acoustic wave (SAW) gas sensors was characterized by atomic force microscopy (AFM), X-ray diffraction (XRD) and conductivity measurements. The films were deposited by r.f. magnetron sputteri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd3b3f8a27b5136269ea4615fc17c663
https://doi.org/10.1016/0040-6090(94)06316-8
https://doi.org/10.1016/0040-6090(94)06316-8
Autor:
R. J. Lad, M. D. Antonik
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 10:669-673
Atomic force microscopy has been used to directly observe the surface microstructure and morphology of several single crystal ceramics which were either cleaved in air or processed in ultrahigh vacuum. Atomic and/or multiatomic height steps and atomi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f5e1bf8f68cc75f7de5933ab8d585f4
https://doi.org/10.1116/1.577707
https://doi.org/10.1116/1.577707
Publikováno v:
Applied Physics Letters. 76:2952-2954
Perturbations to the thermally driven motion of an atomic force microscope (AFM) cantilever can be used to probe tip-sample interactions. One limitation of such thermal-noise-based measurements is that they fail for large attractive interactions with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::832c16d64bf6b9f2a2be2a007db4dbc1
https://doi.org/10.1063/1.126527
https://doi.org/10.1063/1.126527
Publikováno v:
Applied Physics Letters. 61:1921-1923
Epitaxial films of stoichiometric tin oxide were grown on sapphire (1102) substrates by reactive sputter deposition. X‐ray diffraction showed the films to have a single (101) orientation. Lateral registry of film growth with respect to the substrat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4805c0be298e451181e4a298e08bf43
https://doi.org/10.1063/1.108364
https://doi.org/10.1063/1.108364
Publikováno v:
MRS Proceedings. 280
The structure and morphology of clean and Pd-doped epitaxial SnO2 films were studied with the atomic force microscope (AFM). The SnO2 films were grown by reactive sputter deposition on three different substrates yielding epitaxial orientations: (101)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82699a8e871f858ebc580f77531e78bd
https://doi.org/10.1557/proc-280-641
https://doi.org/10.1557/proc-280-641
Publikováno v:
MRS Proceedings. 237
Atomic force microscopy (AFM) and low energy electron diffraction (LEED) have been used to study the faceting behavior on (001) and (100) surfaces of a TiO2 single crystal. On the TiO2 (001) surface, LEED patterns characteristic of {011} facet planes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c93a2cc9a79157fdea5bbdce75c2f256
https://doi.org/10.1557/proc-237-459
https://doi.org/10.1557/proc-237-459