Zobrazeno 1 - 10
of 29
pro vyhledávání: '"M. Cocito"'
Publikováno v:
Active and Passive Electronic Components, Vol 4, Iss 3-4, Pp 205-211 (1977)
Externí odkaz:
https://doaj.org/article/edf9fc752d7c468489f2d288ccec7862
Publikováno v:
Microscopy of Semiconducting Materials, 1983
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11440d7341ac6146d358e3c79ec415b9
https://doi.org/10.1201/9781003069614-41
https://doi.org/10.1201/9781003069614-41
The aims of the Aegean Hydrothermal Fluxes and Biological Production project were to estimate the fluxes of fluids, chemicals, heat and bacteria from hydrothermal vents, establish the controls on venting dynamics, measure the productivity in the regi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2127::fc1e0b26533afcd67d4cb8abe7c6b053
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3018422
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3018422
Publikováno v:
Thin Solid Films. 94:331-339
The structure of the insulant barrier of Nb Pb and Nb (PbIn) thin film Josephson tunnel junctions is studied in detail by Auger electron spectroscopy and X-ray photoelectron spectroscopy analysis. The properties of these two types of junction are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4de2198c148f3934bcddebe18ac0745c
https://doi.org/10.1016/0040-6090(82)90494-1
https://doi.org/10.1016/0040-6090(82)90494-1
Publikováno v:
Thin Solid Films. 51:L5-L8
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2371306f0737d3db42cbcc27b7a9074
https://doi.org/10.1016/0040-6090(78)90206-7
https://doi.org/10.1016/0040-6090(78)90206-7
Publikováno v:
Journal of Crystal Growth. 69:388-398
X-ray topography using both reflection and transmission geometry and scanning electron microscopy in the transmission cathodoluminescence mode have been used for studying a characteristic inclusion-like defect in InP single crystals grown by the liqu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3eb5b61e57b81835358c7c8df879b70
https://doi.org/10.1016/0022-0248(84)90347-6
https://doi.org/10.1016/0022-0248(84)90347-6
Autor:
M. Cocito, M. Melgara
Publikováno v:
Microelectronic Engineering. 7:235-241
The usefulness of E-beam equipment in VLSI validation have been overstressed. However, only recently the necessity of a full integration between the CAD (Computer Aided Design) world and E-Beam world has been felt. The next step further is the comple
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ad828f5651cc643fee45830a37a54c3
https://doi.org/10.1016/s0167-9317(87)80017-5
https://doi.org/10.1016/s0167-9317(87)80017-5
Publikováno v:
Active and Passive Electronic Components, Vol 4, Iss 3-4, Pp 205-211 (1977)
The electrical characteristics of ruthenium-based thick-film resistors with different conductive terminations (PtAu and Ag based compositions) and with different aspect ratios were examined. The purpose is to understand the effects of resistivity dec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d141699dc70db5783045a156e3813082
https://hdl.handle.net/11380/618838
https://hdl.handle.net/11380/618838
Publikováno v:
Advances in Cryogenic Engineering Materials ISBN: 9781461398615
Thin-film-deposited Nb-NbxOy-Pb Josephson tunnel junctions have been adopted at the Istituto Elettrotecnico Nazionale in recent years to improve the monitoring of the Italian voltage standard.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9938c89359bf15b22bce87b85f86a7f2
https://doi.org/10.1007/978-1-4613-9859-2_75
https://doi.org/10.1007/978-1-4613-9859-2_75