Zobrazeno 1 - 10
of 32
pro vyhledávání: '"M. Cannaerts"'
Autor:
Peter Kúš, Š. Gaži, Stefan Chromik, C. Van Haesendonck, Marianna Španková, M. Cannaerts, Š. Beňačka
Publikováno v:
Physica C: Superconductivity. 371:301-308
Thin CeO2 layers were prepared by on-axis radio frequency sputtering on R-plane sapphire substrates that came from two different sources, A (A substrates) and B (B substrates). We have observed reproducible XRD rocking curves (Δω, shape) depending
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9cbc18a3a14634be49e93a10f8cb4498
https://doi.org/10.1016/s0921-4534(01)01098-x
https://doi.org/10.1016/s0921-4534(01)01098-x
Publikováno v:
Nanotechnology. 13:149-152
We have implemented a thermal mapping technique, scanning Joule expansion microscopy, with a high spatial resolution (about 20 nm) in order to investigate heat generation and dissipation in mesoscopic thin-film structures. In particular, we investiga
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92b3f0dc57cce512773fb1cacc510661
https://doi.org/10.1088/0957-4484/13/2/304
https://doi.org/10.1088/0957-4484/13/2/304
Publikováno v:
Diamond and Related Materials. 11:212-217
Scanning tunneling spectroscopy (STS) under high vacuum conditions (2×10 −8 mbar), combined with high-resolution topographical imaging with the scanning tunneling microscope (STM), enabled us to investigate local variations in the electronic struc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::add8fa78ca10bb35f18c3e43c21ffb9b
https://doi.org/10.1016/s0925-9635(01)00645-8
https://doi.org/10.1016/s0925-9635(01)00645-8
Publikováno v:
physica status solidi (a). 186:235-240
Chemical vapor deposited (CVD) diamond films have a controversial history regarding their surface electronic properties. Hydrogenation is known to induce a p-type conductive surface layer, which is not present on non-hydrogenated samples. The enhance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::323e47a8b420044247f4903991c62632
https://doi.org/10.1002/1521-396x(200108)186:2<235::aid-pssa235>3.0.co
https://doi.org/10.1002/1521-396x(200108)186:2<235::aid-pssa235>3.0.co
Autor:
M. Cannaerts, Roger Silverans, A. Depuydt, W. Bouwen, Peter Lievens, N. Vandamme, C. Van Haesendonck, G. Verschoren
Publikováno v:
Applied Physics A Materials Science & Processing. 72:S177-S180
We report on low-energy beam deposition of Aun clusters on atomically flat Au(111) terraces epitaxially grown on mica. Cluster beams were produced by a laser-vaporization source. The size distribution was derived from time of flight mass spectrometry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::572065cb2f5e18a16fac6e7b32635141
https://doi.org/10.1007/s003390100660
https://doi.org/10.1007/s003390100660
Publikováno v:
physica status solidi (a). 181:77-81
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a5eb6624b5005a59f704b46bd761af4
https://doi.org/10.1002/1521-396x(200009)181:1<77::aid-pssa77>3.0.co
https://doi.org/10.1002/1521-396x(200009)181:1<77::aid-pssa77>3.0.co
Autor:
Jean Manca, W. De Ceuninck, Z. Beelen, Marc D'olieslaeger, Jan D'Haen, L. De Schepper, M. Cannaerts, Tom Martens, Karen Maex, J. Van Olmen
Publikováno v:
Microelectronics Reliability. 40:1407-1412
With so-called in-situ SEM experiments, electromigration experiments are performed in a SEM (scanning electron microscope) equipped with a heating stage. BSE (back scattered electron) images are taken continuously over the entire length of a metal li
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89fdfa79da40ceda5c93e5632e0d7116
https://doi.org/10.1016/s0026-2714(00)00170-0
https://doi.org/10.1016/s0026-2714(00)00170-0
Publikováno v:
Applied Surface Science. 157:308-313
In order to study heating phenomena with submicrometer spatial resolution, we have implemented a scanning Joule expansion microscope (SJEM). When compared to scanning thermal microscopy (SThM), which requires the microfabrication of thermal probes, S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86d57bd58ec3f646c193adf5ac9307b9
https://doi.org/10.1016/s0169-4332(99)00544-9
https://doi.org/10.1016/s0169-4332(99)00544-9
Publikováno v:
Applied Physics Letters. 76:1947-1949
The local oxidation produced by the tip of an atomic force microscope scanning on a thin metallic film allows to define narrow oxide lines, thus providing a method to fabricate lateral tunnel junctions. In such devices, with rather thick tunnel junct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0a47ef061ece41f5010316dffb80fe8
https://doi.org/10.1063/1.126221
https://doi.org/10.1063/1.126221
Autor:
M. Cannaerts, B. Pauwels, L. Theil Kuhn, C. Van Haesendonck, G. Van Tendeloo, Frederik Vanhoutte, Peter Lievens, Sven Neukermans, G. Verschoren, Roger Silverans, W. Bouwen
Publikováno v:
Cluster and Nanostructure Interfaces.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64535bfd2d432bb5cd2b64a851d62796
https://doi.org/10.1142/9789812793805_0076
https://doi.org/10.1142/9789812793805_0076