Zobrazeno 1 - 2
of 2
pro vyhledávání: '"M. C. Talmadge"'
Autor:
H. Yoon, Richard R. King, C. M. Fetzer, Nancy M. Haegel, C. L. Frenzen, Clyde L. Scandrett, M. C. Talmadge, T. J. Mills
Publikováno v:
Journal of Applied Physics. 105:023711
The article of record as published may be found at http://dx.doi.org/10.1063/1.3068196 An all-optical technique has been used to provide the first direct measurement of anisotropic minority-carrier diffusion in an ordered alloy of GaInP. Direct imagi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7bfed4213c48c418e18419bd8e64cb95
https://doi.org/10.1063/1.3068196
https://doi.org/10.1063/1.3068196
Publikováno v:
Applied Physics Letters. 88:163509
A scanning electron microscope technique is used, in combination with an optical imaging system, to measure minority carrier diffusion length in a heavily doped GaAs double heterostructure. Diffusion and drift of charge are imaged. A diffusion length
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b2545477b334f71970ecece87586113
https://doi.org/10.1063/1.2196236
https://doi.org/10.1063/1.2196236