Zobrazeno 1 - 10
of 90
pro vyhledávání: '"M. Bammerlin"'
Publikováno v:
Journal of Physics: Conference Series. 61:612-617
Cantilever sensors have created a widespread interest in recent years due to their unique nanomechanical signal generation mechanism. Their applications range from sensing of small molecules, chemicals and biomolecules to on-line monitoring of surfac
Publikováno v:
Nanotechnology. 15:1363-1367
Micro four-point probes fabricated using a conventional silicon microfabrication technique were used to measure the resistivity of thin Au and Pt nanowires deposited with the nanostencil evaporation method in both direct and indirect contact modes. W
Publikováno v:
Applied Physics A. 78:837-841
The atomic structure of surfaces of alkali halide crystals has been revealed by means of high-resolution dynamic force microscopy. True atomic resolution is demonstrated both on steps surrounding islands or pits, and on a chemically mixed crystal. We
Autor:
James K. Gimzewski, Ch. Loppacher, Reto R. Schlittler, Ernst Meyer, M. Bammerlin, M. Guggisberg, R. Lüthi, H.-J. Güntherodt
Publikováno v:
Applied Physics A. 72:S105-S108
Combined STM/AFM experiments were performed on monolayer islands of Cu-TBPP molecules on Cu(100). Pulling of single molecules on the substrate was observed and the imaging parameters were compared to STM studies. Local frequency shift vs. distance cu
Autor:
Ch. Loppacher, M. Bammerlin, Roland Bennewitz, Alexis Baratoff, S. Schär, V. Barwich, Ernst Meyer, M. Guggisberg, Oliver Pfeiffer
Publikováno v:
Applied Physics A. 72:S19-S22
Contrast inversion in nc-AFM on Si(111)7×7 is observed at positive sample bias. Corner holes appear as protrusions and adatoms as holes. The application of negative bias voltages causes drastic changes in the atomic constrast. Frequency shift vs dis
Autor:
H.-J. Güntherodt, Roland Bennewitz, Ch. Loppacher, Ernst Meyer, M. Guggisberg, M. Bammerlin, S. Schär, Alexis Baratoff
Publikováno v:
Physical Review B. 62:16944-16949
Atomic resolution images of Cu(111) and Cu(100) surfaces obtained in ultrahigh vacuum with a combined scanning tunneling (STM)/atomic force microscope (AFM) are presented. Scan lines recorded in the noncontact AFM mode and the constant current mode s
Autor:
Ch. Loppacher, Roland Bennewitz, Alexis Baratoff, S. Schär, V. Barwich, M. Guggisberg, O. Pfeiffer, M. Bammerlin, Ernst Meyer
Publikováno v:
Physical Review B. 62:13674-13679
Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of
Autor:
M. Bammerlin, Jean-Marc Bonard, L. Forró, Roland Bennewitz, Alexis Baratoff, Ch. Loppacher, V. Barwich, O. Pfeiffer, Jean-Paul Salvetat, H.-J. Güntherodt, M. Guggisberg, Ernst Meyer
Publikováno v:
Applied Surface Science. 157:269-273
The demand for sharp and stable tips suggests the use of carbon nanotubes as probing tips in scanning force microscopy. Here, we report a comparison of the long-range forces of conventional tips and nanotube tips, topographical images of various surf
Autor:
Ernst Meyer, Roland Bennewitz, Ch. Loppacher, Oliver Pfeiffer, M. Bammerlin, S. Rast, H.-J. Güntherodt, Urs Gysin, M. Guggisberg, C. Wattinger
Publikováno v:
Applied Surface Science. 157:337-342
The oscillation characteristics of higher flexural modes of a rectangular microfabricated silicon cantilever have been studied in ultra-high vacuum (UHV) for a free cantilever and for a typical situation in non-contact force microscopy. The results a
Autor:
Ch. Loppacher, M. Bammerlin, Roland Bennewitz, Enrico Gnecco, H.-J. Güntherodt, T. Gyalog, Ernst Meyer
Publikováno v:
Scopus-Elsevier
Sliding friction between the tip of a friction force microscope and NaCl(100) was studied to deduce the velocity dependence of friction forces on the atomic scale. A logarithmic dependence of the mean friction force is revealed at low velocities. The