Zobrazeno 1 - 5
of 5
pro vyhledávání: '"M. B. Zellner"'
Autor:
M. B. Zellner, M. S. Freeman, L. P. Neukirch, W. C. Uhlig, P. R. Berning, R. L. Doney, D. Phillips
Publikováno v:
AIP Advances, Vol 11, Iss 5, Pp 055308-055308-12 (2021)
Proton radiography’s utilization of positively charged probing particles makes it susceptible to potential influences from electromagnetic forces generated at the target object. In this work, we investigate how the 800 MeV proton radiography system
Externí odkaz:
https://doaj.org/article/065c67cd155e4a18afdf00d81731d91e
Autor:
D. Phillips, Matthew S. Freeman, R. L. Doney, W. C. Uhlig, P. R. Berning, M. B. Zellner, Levi P. Neukirch
Publikováno v:
AIP Advances, Vol 11, Iss 5, Pp 055308-055308-12 (2021)
Proton radiography’s utilization of positively charged probing particles makes it susceptible to potential influences from electromagnetic forces generated at the target object. In this work, we investigate how the 800 MeV proton radiography system
Publikováno v:
Progress in Photovoltaics: Research and Applications. 11:543-548
We have determined the activation energies of sodium diffusion from the soda-lime glass substrate through the Mo back-contact layer, as well as through copper indium gallium diselenide (CIGS) deposited on the Mo back-contact layer of CIGS thin-film s
Autor:
M. B. Zellner, M. Grover, J. E. Hammerberg, R. S. Hixson, A. J. Iverson, G. S. Macrum, K. B. Morley, A. W. Obst, R. T. Olson, J. R. Payton, P. A. Rigg, N. Routley, G. D. Stevens, W. D. Turley, L. Veeser, W. T. Buttler, Mark Elert, Michael D. Furnish, Ricky Chau, Neil Holmes, Jeffrey Nguyen
Publikováno v:
AIP Conference Proceedings.
Los Alamos National Lab (LANL) is actively engaged in the development of a model to predict the formation of micron‐scale fragments ejected (ejecta) from shocked metals that have surface defects. The LANL ejecta model considers that the amount of e
Determination of activation barriers for the diffusion of sodium through CIGS thin-film solar cells.
Publikováno v:
Progress in Photovoltaics; Dec2003, Vol. 11 Issue 8, p543-548, 6p