Zobrazeno 1 - 10
of 14
pro vyhledávání: '"M. A. Pulido-Gaytan"'
Autor:
M. A. Pulido-Gaytan, Marlon Molina-Cesena, M. C. Maya-Sanchez, José Raúl Loo-Yau, J. Apolinar Reynoso-Hernandez
Publikováno v:
IEEE Microwave and Wireless Components Letters. 32:96-99
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a630ddaf16dd3cf74dc6e0d6fb9adc0
https://doi.org/10.1109/lmwc.2021.3113289
https://doi.org/10.1109/lmwc.2021.3113289
Publikováno v:
International Journal of RF and Microwave Computer-Aided Engineering. 31
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2fcdd64f170ef92395d45af26627b4b
https://doi.org/10.1002/mmce.22889
https://doi.org/10.1002/mmce.22889
Autor:
M. A. Pulido-Gaytan, J. Apolinar Reynoso-Hernandez, M. C. Maya-Sanchez, José Raúl Loo-Yau, R. Cuesta
Publikováno v:
IEEE Microwave and Wireless Components Letters. 30:528-530
For determining the line characteristic impedance ${Z}_{1}$ of uniform transmission lines, it is typically necessary to use a calibrated vector network analyzer (VNA), whose calibration reference impedance ${Z}_{2}$ is known. Using the eight-error te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a7600e434985de6dcc70c303c6efe45
https://doi.org/10.1109/lmwc.2020.2984377
https://doi.org/10.1109/lmwc.2020.2984377
Autor:
M. C. Maya-Sanchez, José Raúl Loo-Yau, J. Apolinar Reynoso-Hernandez, M. A. Pulido-Gaytan, Andres Zarate-de Landa
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 63:1693-1699
The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring sy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b142616f6ef857586d20108b1f9c5608
https://doi.org/10.1109/tmtt.2015.2417860
https://doi.org/10.1109/tmtt.2015.2417860
Autor:
M. del Carmen Maya-Sanchez, A. Zarate-de Landa, M. A. Pulido-Gaytan, J. A. Reynoso-Hernandez, José Raúl Loo-Yau
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 61:3417-3423
In this paper, the line-offset offset-open offset-short (LZZ) calibration technique for vector network analyzers (VNA) is introduced. The LZZ uses as calibration standards a fully known transmission line and two offset reflecting loads. The mathemati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15648a2b2409115f2bf25a0a34819099
https://doi.org/10.1109/tmtt.2013.2275471
https://doi.org/10.1109/tmtt.2013.2275471
Autor:
M. C. Maya-Sanchez, J. L. Urbina-Martinez, M. A. Pulido-Gaytan, J. A. Reynoso-Hernandez, José Raúl Loo-Yau, E. J. Malfavaun-Gonzalez, B. E. Figueroa-Resendiz
Publikováno v:
2016 IEEE MTT-S Latin America Microwave Conference (LAMC).
This paper deals with the implementation of an Envelope Load-Pull system suitable for GaN HEMT power transistors characterization. The novelty of the system, compared with previous Envelope Load-Pull systems lies in its capability to work with packag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5d68f084547aeee9371d9eb922a8b14
https://doi.org/10.1109/lamc.2016.7851291
https://doi.org/10.1109/lamc.2016.7851291
Publikováno v:
2016 87th ARFTG Microwave Measurement Conference (ARFTG).
The thru-reflect-match (TRM) calibration technique uses as calibration structures a thru, a pair of highly reflecting loads and two loads of impedance close to the measuring system impedance (Z0). In practice, the loads used as match standard may be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13f125032d070c4381c1519962db4c7d
https://doi.org/10.1109/arftg.2016.7501959
https://doi.org/10.1109/arftg.2016.7501959
Publikováno v:
2015 86th ARFTG Microwave Measurement Conference.
In this paper, the impact of knowing the impedance of the lines used in the TRL calibration (Z) on the load-pull (LP) characterization of power transistors is assessed. Relevant parameters, such as input impedance (Zin), load impedance (Zld) and larg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ed238f934b8f4b5c79a11d15cfad00f
https://doi.org/10.1109/arftg.2015.7381472
https://doi.org/10.1109/arftg.2015.7381472
Autor:
Juan Luis del Valle-Padilla, J. E. Zuniga-Juarez, José Raúl Loo-Yau, M. A. Pulido-Gaytan, Jaqueline Estrada-Mendoza, J. A. Reynoso-Hernandez, M. C. Maya-Sanchez
Publikováno v:
2015 IEEE MTT-S International Microwave Symposium.
The classical method for extracting the intrinsic elements of the small signal equivalent circuit of the FET is based on the knowledge of intrinsic Y ij -parameters. It requires finding the frequency range where the value of each intrinsic element is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e15e5bbb42284e3939c30af8a6915bcf
https://doi.org/10.1109/mwsym.2015.7167071
https://doi.org/10.1109/mwsym.2015.7167071
Autor:
A. Zarate-de Landa, M. C. Maya-Sanchez, M. A. Pulido-Gaytan, J. A. Reynoso-Hernandez, José Raúl Loo-Yau
Publikováno v:
84th ARFTG Microwave Measurement Conference.
In this paper, the theory of the recently introduced line, offset-open, offset-short (LZZ) calibration technique is extended to develop a calibration procedure comparable to the LRRM calibration technique, the line, open, short, unknown load (LZZM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44f30a3e84ced1ae7df37108922db165
https://doi.org/10.1109/arftg.2014.7013411
https://doi.org/10.1109/arftg.2014.7013411